In the last few decades, an average method which is regulated by ISO 9869-1 has been used to evaluate the in situ thermal transmittance (U-value) and thermal resistance (R-value) of building envelopes obtained from onsite measurements and to verify the validity of newly proposed methods. Nevertheless, only a few studies have investigated the test duration required to obtain reliable results using this method and the convergence characteristics of the results. This study aims to evaluate the convergence characteristics of the in situ values analyzed using the average method. The criteria for determining convergence (i.e., end of the test) using the average method are very strict, mainly because of the third condition, which compares the deviation of two values derived from the first and last periods of the same duration. To shorten the test duration, environmental variables should be kept constant throughout the test or an appropriate period should be selected. The convergence of the in situ U-value and R-value is affected more by the length of the test duration than by the temperature difference if the test environment meets literature-recommended conditions. Furthermore, there is no difference between the use of the U-value and R-value in determining the end of the test.
Analysis of the Characteristics of Bimetallic and Semiconductor Heat Flux Sensors for In-Situ Measurements of Envelope Element Thermal Resistance
