Failure analysis for vibration-based energy harvester utilized in high-speed railroad vehicle

2017 ◽  
Vol 73 ◽  
pp. 85-96 ◽  
Author(s):  
Jae-Hoon Kim ◽  
Ji-Won Jin ◽  
Jang-Ho Lee ◽  
Ki-Weon Kang
Keyword(s):  
Failure Analysis ◽  
High Speed ◽  
Energy Harvester ◽  
Railroad Vehicle ◽  
High Speed Railroad

Nanoprobing Applications with Capacitance-Voltage and Pulsed Current-Voltage Measurements for Device Failure Analysis

2015 ◽  
Author(s):  
LiLung Lai ◽  
Nan Li ◽  
Qi Zhang ◽  
Tim Bao ◽  
Robert Newton
Keyword(s):  
Failure Analysis ◽  
High Speed ◽  
Pulsed Current ◽  
Electrical Measurements ◽  
Device Failure ◽  
Mos Devices ◽  
Atomic Force ◽  
Current Voltage ◽  
Capacitance Voltage ◽  
Rising Time

Abstract Owing to the advancing progress of electrical measurements using SEM (Scanning Electron Microscope) or AFM (Atomic Force Microscope) based nanoprober systems on nanoscale devices in the modern semiconductor laboratory, we already have the capability to apply DC sweep for quasi-static I-V (Current-Voltage), high speed pulsing waveform for the dynamic I-V, and AC imposed for C-V (Capacitance-Voltage) analysis to the MOS devices. The available frequency is up to 100MHz at the current techniques. The specification of pulsed falling/rising time is around 10-1ns and the measurable capacitance can be available down to 50aF, for the nano-dimension down to 14nm. The mechanisms of dynamic applications are somewhat deeper than quasi-static current-voltage analysis. Regarding the operation, it is complicated for pulsing function but much easy for C-V. The effective FA (Failure Analysis) applications include the detection of resistive gate and analysis for abnormal channel doping issue.

Failure analysis and optimization of integral droppers used in high speed railway catenary system

2018 ◽  
Vol 91 ◽  
pp. 496-506 ◽  
Author(s):  
Xi-Yang Liu ◽  
Jin-Fang Peng ◽  
De-Qiang Tan ◽  
Zhi-Biao Xu ◽  
Jian-Hua Liu ◽  
...  
Keyword(s):  
Failure Analysis ◽  
High Speed ◽  
High Speed Railway ◽  
Catenary System

The Fracture Failure Analysis of Precision Centrifuge Spindle

2014 ◽  
Vol 971-973 ◽  
pp. 802-805
Author(s):  
Wei Feng Zhang ◽  
Li Yan ◽  
Fu Xia Zhang
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Chemical Composition ◽  
Fracture Mechanics ◽  
Failure Analysis ◽  
Fatigue Failure ◽  
High Speed ◽  
Experimental Results ◽  
Fracture Failure ◽  
Scanning Electron

For the problem of high-speed rotating centrifuge spindle fracture failures, relevant analyses are conducted from the perspective of microstructure, chemical composition and fracture mechanics by using scanning electron microscopy and related instruments. Experimental results and analyses indicate that the spindle fracture is fatigue failure, mainly caused by cold cracks generated on the journal surfacing. Based on the analysis results, improvements and measures are suggested to better solve the spindle weld fracture failure problems.

Failure analysis of a high-speed pinion shaft

2005 ◽  
Vol 5 (2) ◽  
pp. 48-54 ◽  
Author(s):  
M. E. Stevenson ◽  
J. L. McDougall ◽  
R. D. Bowman ◽  
R. L. Herman
Keyword(s):  
Failure Analysis ◽  
High Speed
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