In Situ probing of solid/liquid interfaces of potassium–oxygen batteries via ambient pressure X-ray photoelectron spectroscopy: New reaction pathways and root cause of battery degradation

2021 ◽  
Vol 36 ◽  
pp. 341-346 ◽  
Author(s):  
Wanwan Wang ◽  
Yu Wang ◽  
Chia-Hsin Wang ◽  
Yaw-Wen Yang ◽  
Yi-Chun Lu
2021 ◽  
Author(s):  
David Starr ◽  
Marco Favaro ◽  
Pip Clark ◽  
Rossella Yivlialin ◽  
Maryline Ralaiarisoa ◽  
...  

Author(s):  
Axel Knop-Gericke ◽  
Verena Pfeifer ◽  
Juan-Jesus Velasco-Velez ◽  
Travis Jones ◽  
Rosa Arrigo ◽  
...  

Surfaces ◽  
2019 ◽  
Vol 2 (1) ◽  
pp. 78-99 ◽  
Author(s):  
Marco Favaro ◽  
Fatwa Abdi ◽  
Ethan Crumlin ◽  
Zhi Liu ◽  
Roel van de Krol ◽  
...  

The development of novel in situ/operando spectroscopic tools has provided the opportunity for a molecular level understanding of solid/liquid interfaces. Ambient pressure photoelectron spectroscopy using hard X-rays is an excellent interface characterization tool, due to its ability to interrogate simultaneously the chemical composition and built-in electrical potentials, in situ. In this work, we briefly describe the “dip and pull” method, which is currently used as a way to investigate in situ solid/liquid interfaces. By simulating photoelectron intensities from a functionalized TiO2 surface buried by a nanometric-thin layer of water, we obtain the optimal photon energy range that provides the greatest sensitivity to the interface. We also study the evolution of the functionalized TiO2 surface chemical composition and correlated band-bending with a change in the electrolyte pH from 7 to 14. Our results provide general information about the optimal experimental conditions for characterizing the solid/liquid interface using the “dip and pull” method, and the unique possibilities offered by this technique.


2021 ◽  
Vol 4 (1) ◽  
Author(s):  
Marc Benjamin Hahn ◽  
Paul M. Dietrich ◽  
Jörg Radnik

AbstractIonizing radiation damage to DNA plays a fundamental role in cancer therapy. X-ray photoelectron-spectroscopy (XPS) allows simultaneous irradiation and damage monitoring. Although water radiolysis is essential for radiation damage, all previous XPS studies were performed in vacuum. Here we present near-ambient-pressure XPS experiments to directly measure DNA damage under water atmosphere. They permit in-situ monitoring of the effects of radicals on fully hydrated double-stranded DNA. The results allow us to distinguish direct damage, by photons and secondary low-energy electrons (LEE), from damage by hydroxyl radicals or hydration induced modifications of damage pathways. The exposure of dry DNA to x-rays leads to strand-breaks at the sugar-phosphate backbone, while deoxyribose and nucleobases are less affected. In contrast, a strong increase of DNA damage is observed in water, where OH-radicals are produced. In consequence, base damage and base release become predominant, even though the number of strand-breaks increases further.


2017 ◽  
Vol 53 (37) ◽  
pp. 5231-5234 ◽  
Author(s):  
Jack Chun-Ren Ke ◽  
Alex S. Walton ◽  
David J. Lewis ◽  
Aleksander Tedstone ◽  
Paul O'Brien ◽  
...  

Near-ambient-pressure X-ray photoelectron spectroscopy enables the study of the reaction of in situ-prepared methylammonium lead iodide (MAPI) perovskite at realistic water vapour pressures for the first time.


2015 ◽  
Vol 174 ◽  
pp. 532-541 ◽  
Author(s):  
Benedetto Bozzini ◽  
Matteo Amati ◽  
Patrizia Bocchetta ◽  
Simone Dal Zilio ◽  
Axel Knop-Gericke ◽  
...  

Surfaces ◽  
2020 ◽  
Vol 3 (3) ◽  
pp. 392-407
Author(s):  
Marco Favaro

Molecular-level understanding of electrified solid/liquid interfaces has recently been enabled thanks to the development of novel in situ/operando spectroscopic tools. Among those, ambient pressure photoelectron spectroscopy performed in the tender/hard X-ray region and coupled with the “dip and pull” method makes it possible to simultaneously interrogate the chemical composition of the interface and built-in electrical potentials. On the other hand, only thin liquid films (on the order of tens of nanometers at most) can be investigated, since the photo-emitted electrons must travel through the electrolyte layer to reach the photoelectron analyzer. Due to the challenging control and stability of nm-thick liquid films, a detailed experimental electrochemical investigation of such thin electrolyte layers is still lacking. This work therefore aims at characterizing the electrochemical behavior of solid/liquid interfaces when confined in nanometer-sized regions using a stochastic simulation approach. The investigation was performed by modeling (i) the electron transfer between a solid surface and a one-electron redox couple and (ii) its diffusion in solution. Our findings show that the well-known thin-layer voltammetry theory elaborated by Hubbard can be successfully applied to describe the voltammetric behavior of such nanometer-sized interfaces. We also provide an estimation of the current densities developed in these confined interfaces, resulting in values on the order of few hundreds of nA·cm−2. We believe that our results can contribute to the comprehension of the physical/chemical properties of nano-interfaces, thereby aiding to a better understanding of the capabilities and limitations of the “dip and pull” method.


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