scholarly journals Nucleate boiling from smooth and rough surfaces – Part 1: Fabrication and characterization of an optically transparent heater–sensor substrate with controlled surface roughness

2013 ◽  
Vol 44 ◽  
pp. 456-467 ◽  
Author(s):  
John P. McHale ◽  
Suresh V. Garimella
Author(s):  
H. Fukanuma

Abstract Thermal spray layers are formed on rough surfaces; however, the flattening process on rough surfaces has not yet been clarified. A mathematical flattening model which takes into account the roughness of the substrate or previously coated layers is proposed in this paper. As a result of surface roughness, the flattening degree and the flattening time decrease with increasing surface roughness in this model. In addition, the characterization of surface roughness is introduced for the flattening model. Several calculated cases of the flattening model are shown.


Micromachines ◽  
2020 ◽  
Vol 11 (12) ◽  
pp. 1080
Author(s):  
Julia Heupel ◽  
Maximilian Pallmann ◽  
Jonathan Körber ◽  
Rolf Merz ◽  
Michael Kopnarski ◽  
...  

The development of quantum technologies is one of the big challenges in modern research. A crucial component for many applications is an efficient, coherent spin–photon interface, and coupling single-color centers in thin diamond membranes to a microcavity is a promising approach. To structure such micrometer thin single-crystal diamond (SCD) membranes with a good quality, it is important to minimize defects originating from polishing or etching procedures. Here, we report on the fabrication of SCD membranes, with various diameters, exhibiting a low surface roughness down to 0.4 nm on a small area scale, by etching through a diamond bulk mask with angled holes. A significant reduction in pits induced by micromasking and polishing damages was accomplished by the application of alternating Ar/Cl2 + O2 dry etching steps. By a variation of etching parameters regarding the Ar/Cl2 step, an enhanced planarization of the surface was obtained, in particular, for surfaces with a higher initial surface roughness of several nanometers. Furthermore, we present the successful bonding of an SCD membrane via van der Waals forces on a cavity mirror and perform finesse measurements which yielded values between 500 and 5000, depending on the position and hence on the membrane thickness. Our results are promising for, e.g., an efficient spin–photon interface.


1985 ◽  
Vol 54 ◽  
Author(s):  
J. R. Blanco ◽  
K. Vedam ◽  
P. J. McMarr ◽  
J. M. Bennett

ABSTRACTWell characterized rough surfaces of aluminum films have been studied by the nondestructive technique of Spectroscopie Ellipsometry (SE). The roughness of the aluminum specimens had been characterized earlier by Total Integrated Scattering and Stylus Profilometry techniques to obtain numerical estimates of ras roughness and autocovariance lengths. The present SE measurements on these specimens were carried out at a number of angles of incidence in the range 30–80° and at a number of discrete wavelengths in the spectral range 300–650nm. The SE results were then analyzed by the scalar theory of diffraction from random rough surfaces by treating the surface as a simple random rough surface. The results of such analyses of the SE measurements are compared with the results of the earlier characterization techniques.


2013 ◽  
Vol 690-693 ◽  
pp. 2185-2188
Author(s):  
Shao Bo Cui ◽  
Zhong Yuan Lu ◽  
Feng Wei He

The magnetic polymer ICF targets are fabricated by depositing the Ni-P coats on the surface of polystyrene microsphere using the electroless plating. The microstructur of the coat, and the magnetic property, surface roughness and sphericity of the magnetic microsphere were examined and analyzed, resperctively. The results indicated the examined indexes can basically meet the requirements of ICF targets.


2012 ◽  
Vol 10 (0) ◽  
pp. 591-593
Author(s):  
Katsumi Shimizu ◽  
Syoushi Higuchi ◽  
Amane Kitahara ◽  
Hikaru Terauchi ◽  
Isao Takahashi

Author(s):  
D.-L. Liu ◽  
J. Martin ◽  
N. A. Burnham

Surface roughness has a significant affect on adhesion. We used a single-asperity model to describe a smooth tip in contact with a rough surface and predicted that an optimal size of asperity will yield a minimum of adhesion. Experimentally, adhesive forces on silicon wafers with varying roughness were measured using AFM cantilevers with varying tip radii. It was found that minima do exist, and for all tip radii, the adhesion falls significantly for roughness greater than 1–2 nm and drops at higher roughness for larger tips. In addition to RMS roughness, the roughness exponent is another important parameter for the characterization of rough surfaces and its affect on adhesion was also investigated. We developed computer programs to simulate a set of fractal rough surfaces with differing roughness exponents. The adhesive forces between an AFM tip and the fractal surfaces were calculated and the adhesion was seen to decrease as the roughness exponent increases. This work should help minimize MEMS stiction and progress the understanding of nanoscale contact mechanics.


2019 ◽  
Vol 35 (4) ◽  
pp. 475-484
Author(s):  
SHIVA ARUN ◽  
◽  
PRABHA BHARTIYA ◽  
AMREEN NAZ ◽  
SUDHEER RAI ◽  
...  

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