Deuterium retention and surface morphology modification in oxidized tungsten exposed to D plasma

Author(s):  
S.A. Puyang ◽  
Y.M. Lyu ◽  
F.F. Nian ◽  
Y.P. Xu ◽  
Z.S. Yang ◽  
...  
2021 ◽  
Vol 11 (4) ◽  
pp. 1619
Author(s):  
Jing Yan ◽  
Xia Li ◽  
Kaigui Zhu

The surface morphology of pure W bulks and nanocrystalline tungsten films was investigated after exposure to a low-energy (100 eV/D), high-flux (1.8 × 1021 D·m−2s−1) deuterium plasma. Nanocrystalline tungsten films of 6 μm thickness were deposited on tungsten bulks and exposed to deuterium plasma at various fluences ranging from 1.30 × 1025 to 5.18 × 1025 D·m−2. Changes in surface morphology from before to after irradiation were studied with scanning electron microscopy (SEM). The W bulk exposed to low-fluence plasma (1.30 × 1025 D·m−2) shows blisters. The blisters on the W bulk irradiated to higher-fluence plasma are much larger (~2 µm). The blisters on the surface of W films are smaller in size and lower in density than those of the W bulks. In addition, the modifications exhibit the appearance of cracks below the surface after deuterium plasma irradiation. It is suggested that the blisters are caused by the diffusion and aggregation of the deuterium-vacancy clusters. The deuterium retention of the W bulks and nanocrystalline tungsten films was studied using thermal desorption spectroscopy (TDS). The retention of deuterium in W bulks and W films increases with increasing deuterium plasma fluence when irradiated at 500 K.


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Author(s):  
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S. Lindig ◽  
Y. Hatano ◽  
M. Balden ◽  
...  

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