A method for distributed sensing of temperature, strain and weight formations employing the acoustic velocity and Bulk modulus of fused silica

AbstractFiber Bragg grating (FBG) array is a powerful technique for quasi-distributed sensing along the entire length of sensing fiber with fast response and high precision. It has been widely used for temperature, strain, and vibration monitoring. In this review work, an overview on the recent advances of FBG arrays is conducted. Firstly, the fabrication methods of FBG array are reviewed, which include femtosecond laser system and online writing technique. Then, the demodulation techniques for FBG arrays are presented and discussed. Distributed static sensing can be performed by demodulating wavelength shift of each FBG, while phase demodulation techniques with low noise are employed for dynamic vibration sensing. Simultaneous distributed dynamic and static sensing system based on FBG array is also outlined. Finally, possible future directions are discussed and concluded. It is believed that the FBG array has great development potential and application prospect.

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SEM analysis of DC magnetron sputtered beryllium films

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100106867 ◽

1988 ◽

Vol 46 ◽

pp. 960-961

Author(s):

E. F. Lindsey ◽

C. W. Price ◽

E. L. Pierce ◽

E. J. Hsieh

Keyword(s):

Fine Structure ◽

Electron Emission ◽

Secondary Electron ◽

Low Voltage ◽

Ion Beam ◽

Secondary Electron Emission ◽

Sem Analysis ◽

Fused Silica ◽

Grain Structure ◽

Silica Substrate

Columnar structures produced by DC magnetron sputtering can be altered by using RF biased sputtering or by exposing the film to nitrogen pulses during sputtering, and these techniques are being evaluated to refine the grain structure in sputtered beryllium films deposited on fused silica substrates. Beryllium is brittle, and fractures in sputtered beryllium films tend to be intergranular; therefore, a convenient technique to analyze grain structure in these films is to fracture the coated specimens and examine them in an SEM. However, fine structure in sputtered deposits is difficult to image in an SEM, and both the low density and the low secondary electron emission coefficient of beryllium seriously compound this problem. Secondary electron emission can be improved by coating beryllium with Au or Au-Pd, and coating also was required to overcome severe charging of the fused silica substrate even at low voltage. The coating structure can obliterate much of the fine structure in beryllium films, but reasonable results were obtained by using the high-resolution capability of an Hitachi S-800 SEM and either ion-beam coating with Au-Pd or carbon coating by thermal evaporation.

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