Precise isotopic measurements of sub-nanogram Nd of standard reference material by thermal ionization mass spectrometry using the NdO+ technique

2007 ◽  
Vol 266 (1-3) ◽  
pp. 34-41 ◽  
Author(s):  
Chao-Feng Li ◽  
Fukun Chen ◽  
Xiang-Hui Li
Keyword(s):  
Mass Spectrometry ◽  
Reference Material ◽  
Standard Reference Material ◽  
Thermal Ionization Mass Spectrometry ◽  
Thermal Ionization ◽  
Ionization Mass Spectrometry ◽  
Ionization Mass ◽  
Thermal Ionization Mass ◽  
Isotopic Measurements

Isotopic analysis of depleted zinc in Zn-64 using thermal ionization mass spectrometry

2015 ◽  
Vol 7 (24) ◽  
pp. 10452-10456 ◽  
Author(s):  
Eduardo A. Gautier ◽  
Marta A. Bavio ◽  
Mauricio A. Fernández
Keyword(s):  
Mass Spectrometry ◽  
Thermal Ionization Mass Spectrometry ◽  
Isotopic Analysis ◽  
Thermal Ionization ◽  
Ionization Mass Spectrometry ◽  
Ionization Mass ◽  
Isotopic Abundance ◽  
Precise Method ◽  
Thermal Ionization Mass ◽  
Isotopic Measurements

A simple and precise method was developed for zinc isotopic measurements using TIMS. The method was successfully applied to control the Zn isotopic abundance in a ZnO sample.

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