On spherical nanoinhomogeneity embedded in a half-space analyzed with Steigmann–Ogden surface and interface models

2021 ◽  
Vol 216 ◽  
pp. 123-135
Author(s):  
Youxue Ban ◽  
Changwen Mi
Keyword(s):  
Half Space ◽  
Surface And Interface ◽  
Interface Models

Nucleation and initial growth of Pd2Si crystals on Si(111)

1993 ◽  
Vol 51 ◽  
pp. 844-845
Author(s):  
Xianghong Tong ◽  
Oliver Pohland ◽  
J. Murray Gibson
Keyword(s):  
High Vacuum ◽  
Dark Field ◽  
Ultra High Vacuum ◽  
Initial Growth ◽  
Surface And Interface ◽  
Dark Field Imaging ◽  
Transmission Electron ◽  
Initial Stage ◽  
Effect Of Surface

The nucleation and initial stage of Pd2Si crystals on Si(111) surface is studied in situ using an Ultra-High Vacuum (UHV) Transmission Electron Microscope (TEM). A modified JEOL 200CX TEM is used for the study. The Si(111) sample is prepared by chemical thinning and is cleaned inside the UHV chamber with base pressure of 1x10−9 τ. A Pd film of 20 Å thick is deposited on to the Si(111) sample in situ using a built-in mini evaporator. This room temperature deposited Pd film is thermally annealed subsequently to form Pd2Si crystals. Surface sensitive dark field imaging is used for the study to reveal the effect of surface and interface steps.The initial growth of the Pd2Si has three stages: nucleation, growth of the nuclei and coalescence of the nuclei. Our experiments shows that the nucleation of the Pd2Si crystal occurs randomly and almost instantaneously on the terraces upon thermal annealing or electron irradiation.

On a technique for deriving explicit transfer matrices of orthotropic layers

2015 ◽  
Vol 37 (4) ◽  
pp. 303-315 ◽  
Author(s):  
Pham Chi Vinh ◽  
Nguyen Thi Khanh Linh ◽  
Vu Thi Ngoc Anh
Keyword(s):  
Wave Propagation ◽  
Explicit Form ◽  
Half Space ◽  
Transfer Matrix ◽  
Rayleigh Waves ◽  
Secular Equation ◽  
Transfer Matrices ◽  
Orthotropic Layer ◽  
Wave Propagation Problem ◽  
Arbitrary Thickness

This paper presents  a technique by which the transfer matrix in explicit form of an orthotropic layer can be easily obtained. This transfer matrix is applicable for both the wave propagation problem and the reflection/transmission problem. The obtained transfer matrix is then employed to derive the explicit secular equation of Rayleigh waves propagating in an orthotropic half-space coated by an orthotropic layer of arbitrary thickness.

SH-Wave Scattering From the Interface Defect

2017 ◽  
Vol 5 (1) ◽  
pp. 45-50
Author(s):  
Myron Voytko ◽  
◽  
Yaroslav Kulynych ◽  
Dozyslav Kuryliak
Keyword(s):  
Half Space ◽  
Wave Diffraction ◽  
Scattered Field ◽  
Wave Scattering ◽  
Elastic Layer ◽  
Analytical Form ◽  
Structure Parameters ◽  
Sh Wave ◽  
Interface Defect ◽  
Hopf Method

The problem of the elastic SH-wave diffraction from the semi-infinite interface defect in the rigid junction of the elastic layer and the half-space is solved. The defect is modeled by the impedance surface. The solution is obtained by the Wiener- Hopf method. The dependences of the scattered field on the structure parameters are presented in analytical form. Verifica¬tion of the obtained solution is presented.

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