Giant magnetoimpedance in electrodeposited CoNiFe/Cu wire: A study on thickness dependence

2009 ◽  
Vol 480 (2) ◽  
pp. 771-776 ◽  
Author(s):  
Amaresh Chandra Mishra ◽  
Trilochan Sahoo ◽  
V. Srinivas ◽  
Awalendra K. Thakur
2011 ◽  
Vol 509 (5) ◽  
pp. 1360-1363 ◽  
Author(s):  
Jifan Hu ◽  
Yifei Wang ◽  
Yongjia Zhang ◽  
Hua Liu ◽  
Hongwei Qin ◽  
...  

1981 ◽  
Vol 42 (C6) ◽  
pp. C6-825-C6-827
Author(s):  
P. Taborek ◽  
M. Sinvani ◽  
M. Weimer ◽  
D. Goodstein

1989 ◽  
Vol 50 (C6) ◽  
pp. C6-177-C6-177
Author(s):  
J. YUAN ◽  
S. BERGER ◽  
L. M. BROWN

2002 ◽  
Vol 719 ◽  
Author(s):  
Masashi Kato ◽  
Masaya Ichimura ◽  
Eisuke Arai ◽  
Shigehiro Nishino

AbstractEpitaxial layers of 4H-SiC are grown on (0001) substrates inclined toward <1120> and <1100> directions. Defects in these films are characterized by deep level transient spectroscopy (DLTS) in order to clarify the dependence of concentrations and activation energies on substrate inclination. DLTS results show no such dependence on substrate inclination but show thickness dependence of the concentration.


1978 ◽  
Vol 13 (9) ◽  
pp. 427-431
Author(s):  
E. Bodegom ◽  
R. Coelho ◽  
T.J. Gallagher

2013 ◽  
Vol 49 (7) ◽  
pp. 4044-4047 ◽  
Author(s):  
Hiroaki Kikuchi ◽  
Junichi Kumano ◽  
Tomoo Nakai ◽  
Yuki Onodera ◽  
Shuichiro Hashi ◽  
...  

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