Electron-backscattered diffraction and transmission electron microscopy study of post-creep Ti3SiC2

2009 ◽  
Vol 488 (1) ◽  
pp. 181-189 ◽  
Author(s):  
F. Barcelo ◽  
S. Doriot ◽  
T. Cozzika ◽  
M. Le Flem ◽  
J.L. Béchade ◽  
...  
1994 ◽  
Vol 70 (5) ◽  
pp. 1077-1094 ◽  
Author(s):  
J. J. Couderc ◽  
S. Fritsch ◽  
M. Brieu ◽  
G. Vanderschaeve ◽  
M. Fagot ◽  
...  

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