Electron-backscattered diffraction and transmission electron microscopy study of post-creep Ti3SiC2
2009 ◽
Vol 488
(1)
◽
pp. 181-189
◽
2002 ◽
Vol 82
(4)
◽
pp. 735-749
◽
1996 ◽
Vol 74
(2)
◽
pp. 57-66
◽
1994 ◽
Vol 70
(5)
◽
pp. 1077-1094
◽