Defect photoluminescence and structure properties of undoping (InxGa1-x)2O3 films and their dependence on sputtering pressure

2020 ◽  
Vol 823 ◽  
pp. 153903 ◽  
Author(s):  
Hongliang Lu ◽  
Shujie Jiao ◽  
Yiyin Nie ◽  
Shuo Liu ◽  
Shiyong Gao ◽  
...  
Keyword(s):  
Sputtering Pressure ◽  
Structure Properties

The effect of sputtering pressure on electrical, optical and structure properties of indium tin oxide on glass

2010 ◽  
Vol 518 (12) ◽  
pp. 3326-3331 ◽  
Author(s):  
S. Elhalawaty ◽  
K. Sivaramakrishnan ◽  
N.D. Theodore ◽  
T.L. Alford
Keyword(s):  
Tin Oxide ◽  
Indium Tin Oxide ◽  
Sputtering Pressure ◽  
Structure Properties

Trace nanoanalysis

1994 ◽  
Vol 52 ◽  
pp. 940-941
Author(s):  
D. E. Newbury ◽  
R. D. Leapman
Keyword(s):  
High Performance ◽  
Secondary Ion Mass Spectrometry ◽  
Detection Efficiency ◽  
Volume Element ◽  
And Performance ◽  
Trace Constituents ◽  
Secondary Ion ◽  
Concentration Levels ◽  
Structure Properties

Trace constituents, which can be very loosely defined as those present at concentration levels below 1 percent, often exert influence on structure, properties, and performance far greater than what might be estimated from their proportion alone. Defining the role of trace constituents in the microstructure, or indeed even determining their location, makes great demands on the available array of microanalytical tools. These demands become increasingly more challenging as the dimensions of the volume element to be probed become smaller. For example, a cubic volume element of silicon with an edge dimension of 1 micrometer contains approximately 5×1010 atoms. High performance secondary ion mass spectrometry (SIMS) can be used to measure trace constituents to levels of hundreds of parts per billion from such a volume element (e. g., detection of at least 100 atoms to give 10% reproducibility with an overall detection efficiency of 1%, considering ionization, transmission, and counting).

Advancing the use of Voronoi–Dirichlet polyhedra to describe interactions in organic molecular crystal structures by the example of galunisertib polymorphs

CrystEngComm ◽  
2021 ◽  
Author(s):  
Viktor N. Serezhkin ◽  
Anton V. Savchenkov
Keyword(s):  
Crystal Structures ◽  
Molecular Crystal ◽  
Noncovalent Interactions ◽  
Organic Molecular Crystal ◽  
Universal Approach ◽  
Structure Properties

The universal approach for studying structure/properties relationships shows that every polymorph of galunisertib is characterized with unique noncovalent interactions.

Synthetic Zeolites- Structure Properties and Application Area

2012 ◽  
Vol 3 (6) ◽  
pp. 78-80 ◽  
Author(s):  
Richa Gangele ◽  
◽  
Priya Pawaiya ◽  
Yogesh Pandey
Keyword(s):  
Application Area ◽  
Synthetic Zeolites ◽  
Structure Properties

NEW COMPLEXES OF 2-(1H-1, 2, 4-TRIAZOL-3-YL) PYRIDINE WITH Co(II), Cd(II), Rh(III), IONS: SYNTHESIS, STRUCTURE, PROPERTIES AND POTENTIAL APPLICATIONS

2015 ◽  
Vol 14 (2) ◽  
pp. 389-397
Author(s):  
Corneliu S. Stan ◽  
Petronela Horlescu ◽  
Daniel Sutiman ◽  
Carmen Mita ◽  
Cristian Peptu ◽  
...  
Keyword(s):  
Potential Applications ◽  
Structure Properties

Effect of Sputtering Pressure on Al-doped ZnO Films by DC Magnetron Sputtering

2013 ◽  
Vol 27 (10) ◽  
pp. 1112-1116 ◽  
Author(s):  
Ke-Wei SUN ◽  
Wan-Cheng ZHOU ◽  
Shan-Shan HUANG ◽  
Xiu-Feng TANG
Keyword(s):  
Magnetron Sputtering ◽  
Zno Films ◽  
Dc Magnetron Sputtering ◽  
Doped Zno ◽  
Sputtering Pressure

scholarly journals Advances in Rare‐Earth Tritelluride Quantum Materials: Structure, Properties, and Synthesis

2021 ◽  
pp. 2004762
Author(s):  
Kentaro Yumigeta ◽  
Ying Qin ◽  
Han Li ◽  
Mark Blei ◽  
Yashika Attarde ◽  
...  
Keyword(s):  
Rare Earth ◽  
Quantum Materials ◽  
Structure Properties

scholarly journals Three-Dimensional (3D) Laser-Induced Graphene: Structure, Properties, and Application to Chemical Sensing

2021 ◽  
Author(s):  
Federico Maria Vivaldi ◽  
Alexander Dallinger ◽  
Andrea Bonini ◽  
Noemi Poma ◽  
Lorenzo Sembranti ◽  
...  
Keyword(s):  
Chemical Sensing ◽  
Three Dimensional ◽  
Structure Properties
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