Photovoltaic conversion enhancement of a transparent NiO/CdO/ZnO pn junction device with a CdO transition layer

2021 ◽  
Vol 862 ◽  
pp. 158430
Author(s):  
Peipei Wang ◽  
Jiaqi Pan ◽  
Jie Mei ◽  
Qi Yu ◽  
Panhong Wang ◽  
...  
2001 ◽  
Vol 669 ◽  
Author(s):  
Jeong Young Park ◽  
R. J. Phaneuf ◽  
E. D. Williams

ABSTRACTSimultaneous conductance imaging and constant current mode STM imaging have been used to delineate Si pn junction arrays over a range of reverse bias conditions. Conductance has been obtained by adding a modulation signal to voltages applied in the p and n regions of a model device, and by measuring the modulation signal of the tunneling current with a lock-in amplifier. Both constant current and conductance imaging ofthe electrically different regions (n, p, and depletion zone) show a pronounced dependence on applied pn junction bias. The conductance contrast is mainly due to electrically different behaviors of metal-gap-semiconductor junction which are determined by the tip-induced band bending of the oxide-passivated silicon surface.


2021 ◽  
Vol 56 (9) ◽  
pp. 5736-5747
Author(s):  
Qi Yu ◽  
Jiaqi Pan ◽  
Jie Mei ◽  
Zhanfen Chen ◽  
Panhong Wang ◽  
...  
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