Numerical simulation of heat and mass transfer during Czochralski silicon crystal growth under the application of crystal-crucible counter- and iso-rotations

2019 ◽  
Vol 507 ◽  
pp. 50-57 ◽  
Author(s):  
Thi Hoai Thu Nguyen ◽  
Jyh Chen Chen ◽  
Chieh Hu ◽  
Chun Hung Chen
2003 ◽  
Vol 38 (6) ◽  
pp. 499-505 ◽  
Author(s):  
A. Voigt ◽  
C. Weichmann ◽  
J. Nitschkowski ◽  
E. Dornberger ◽  
R. Hölz

Rare Metals ◽  
2017 ◽  
Vol 36 (2) ◽  
pp. 134-141 ◽  
Author(s):  
Ran Teng ◽  
Yang Li ◽  
Bin Cui ◽  
Qing Chang ◽  
Qing-Hua Xiao ◽  
...  

2000 ◽  
Vol 211 (1-4) ◽  
pp. 333-338 ◽  
Author(s):  
M. Selder ◽  
L. Kadinski ◽  
Yu. Makarov ◽  
F. Durst ◽  
P. Wellmann ◽  
...  

1995 ◽  
Vol 378 ◽  
Author(s):  
W. Wijaranakula ◽  
Q. S. Zhang ◽  
K. Takano ◽  
H. Yamagishi

AbstractNumerical simulation of point defect distributions in a growing Czochralski silicon crystal with an abrupt change in the crystal growth rate from 1.0 to 0.4 mm/min was performed. The result was fitted to the experimental data for the flow pattern defects obtained from a crystal grown under simulated conditions. From the simulation result, it was observed that the axial temperature distribution shifts slightly upwards as a result of the growth rate reduction. Based upon the argument that the flow pattern defects are of vacancy-type, it is proposed that the generation rate of the flow pattern defects during crystal growth can be described by the classical nucleation rate theory proposed by Becker [Proc.Phys.Soc., 52, 71(1940)]. In addition, it is suggested that the vacancy concentration in the flow pattern defects depends upon the reaction time between the silicon interstitials and the flow pattern defects and thus the crystal growth rate.


2021 ◽  
pp. 1-14
Author(s):  
Chao Gui ◽  
Leren Tao ◽  
Weifang Yang ◽  
Yaqi Zhang ◽  
Shanshan Chen ◽  
...  

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