LaNiO3 seed layer induced enhancement of piezoelectric properties in (100)-oriented (1−x)BZT–xBCT thin films

2015 ◽  
Vol 35 (7) ◽  
pp. 2041-2049 ◽  
Author(s):  
W.L. Li ◽  
T.D. Zhang ◽  
D. Xu ◽  
Y.F. Hou ◽  
W.P. Cao ◽  
...  
Keyword(s):  
Thin Films ◽  
Seed Layer ◽  
Piezoelectric Properties

Giant piezoelectric properties of BZT–0.5BCT thin films induced by nanodomain structure

RSC Advances ◽  
2014 ◽  
Vol 4 (100) ◽  
pp. 56933-56937 ◽  
Author(s):  
W. L. Li ◽  
T. D. Zhang ◽  
Y. F. Hou ◽  
Y. Zhao ◽  
D. Xu ◽  
...  
Keyword(s):  
Thin Films ◽  
Magnetron Sputtering ◽  
Seed Layer ◽  
Piezoelectric Properties ◽  
Sol Gel ◽  
Si Substrates ◽  
Gel Technique ◽  
Nanodomain Structure

Ba(Zr0.2Ti0.8)O3–0.5(Ba0.7Ca0.3)TiO3 (BZT–0.5BCT) thin films were prepared from two ceramics targets, Ba(Zr0.2Ti0.8)O3 and (Ba0.7Ca0.3)TiO3, using dual-magnetron sputtering, and a LaNiO3 (LNO) seed layer was introduced between the film and Pt(111)/Ti/SiO2/Si substrates via a sol–gel technique.

Growth and piezoelectric properties of amorphous and crystalline (K1−xNax)NbO3−based thin films

2021 ◽  
Author(s):  
Jong-Un Woo ◽  
Sun-Woo Kim ◽  
Dae-Su Kim ◽  
In-Su Kim ◽  
Ho-Sung Shin ◽  
...  
Keyword(s):  
Thin Films ◽  
Piezoelectric Properties

Enhanced energy-storage performance of 0.94NBT-0.06BT thin films induced by a Pb 0.8 La 0.1 Ca 0.1 Ti 0.975 O 3 seed layer

2016 ◽  
Vol 42 (13) ◽  
pp. 14788-14792 ◽  
Author(s):  
Y.L. Zhang ◽  
W.L. Li ◽  
W.P. Cao ◽  
T.D. Zhang ◽  
T.R.G.L. Bai ◽  
...  
Keyword(s):  
Thin Films ◽  
Energy Storage ◽  
Seed Layer ◽  
Storage Performance

scholarly journals Direct measurement of the thermoelectric properties of electrochemically deposited Bi2Te3 thin films

2020 ◽  
Vol 10 (1) ◽  
Author(s):  
Jose Recatala-Gomez ◽  
Pawan Kumar ◽  
Ady Suwardi ◽  
Anas Abutaha ◽  
Iris Nandhakumar ◽  
...  
Keyword(s):  
Thin Films ◽  
Thermoelectric Properties ◽  
Bismuth Telluride ◽  
Indium Tin Oxide ◽  
Seed Layer ◽  
Room Temperature ◽  
Low Cost ◽  
Temperature Dependent ◽  
Temperature Heat ◽  
Electrochemically Deposited

Abstract The best known thermoelectric material for near room temperature heat-to-electricity conversion is bismuth telluride. Amongst the possible fabrication techniques, electrodeposition has attracted attention due to its simplicity and low cost. However, the measurement of the thermoelectric properties of electrodeposited films is challenging because of the conducting seed layer underneath the film. Here, we develop a method to directly measure the thermoelectric properties of electrodeposited bismuth telluride thin films, grown on indium tin oxide. Using this technique, the temperature dependent thermoelectric properties (Seebeck coefficient and electrical conductivity) of electrodeposited thin films have been measured down to 100 K. A parallel resistor model is employed to discern the signal of the film from the signal of the seed layer and the data are carefully analysed and contextualized with literature. Our analysis demonstrates that the thermoelectric properties of electrodeposited films can be accurately evaluated without inflicting any damage to the films.

Optimization of the annealing process and nanoscale piezoelectric properties of (002) AlN thin films

2017 ◽  
Vol 28 (13) ◽  
pp. 9295-9300 ◽  
Author(s):  
Bangran Fu ◽  
Fang Wang ◽  
Rongrong Cao ◽  
Yemei Han ◽  
Yinping Miao ◽  
...  
Keyword(s):  
Thin Films ◽  
Piezoelectric Properties ◽  
Annealing Process

scholarly journals Correlation between nanomechanical and piezoelectric properties of thin films: An experimental and finite element study

2013 ◽  
Vol 90 ◽  
pp. 148-151 ◽  
Author(s):  
Hussein Nili ◽  
Guang Cheng ◽  
T.A. Venkatesh ◽  
Sharath Sriram ◽  
Madhu Bhaskaran
Keyword(s):  
Thin Films ◽  
Finite Element ◽  
Piezoelectric Properties ◽  
Finite Element Study ◽  
Element Study
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