Evolution of dislocation loops in annealed iron pre-irradiated with hydrogen ion in high-voltage electron microscope

2016 ◽  
Vol 481 ◽  
pp. 81-87 ◽  
Author(s):  
Jin Gao ◽  
Yufeng Du ◽  
Somei Ohnuki ◽  
Farong Wan
Keyword(s):  
Electron Microscope ◽  
High Voltage ◽  
Hydrogen Ion ◽  
Dislocation Loops ◽  
Voltage Electron ◽  
High Voltage Electron Microscope ◽  
High Voltage Electron

Dislocation Loops Formed in Aluminum in a High Voltage Electron Microscope

1971 ◽  
Vol 30 (1) ◽  
pp. 295-295 ◽  
Author(s):  
Kensuke Shiraishi ◽  
Akimichi Hishinuma ◽  
Yoshio Katano ◽  
Tadami Taoka
Keyword(s):  
Electron Microscope ◽  
High Voltage ◽  
Dislocation Loops ◽  
Voltage Electron ◽  
High Voltage Electron Microscope ◽  
High Voltage Electron

Loop and Void Formation in Copper During High Voltage Electron Microscope Irradiation

1973 ◽  
Vol 31 ◽  
pp. 22-23
Author(s):  
E. A. Kenik ◽  
T. E. Mitchell
Keyword(s):  
Electron Microscope ◽  
High Voltage ◽  
Void Nucleation ◽  
Cold Work ◽  
Void Formation ◽  
Dislocation Loops ◽  
Voltage Electron ◽  
High Voltage Electron Microscope ◽  
High Voltage Electron ◽  
Set Up

The formation of dislocation loops and voids under neutron, ion, and electron irradiation is well documented. Since irradiation produces Frenkel pairs, the presence of biased interstitial sinks is required for void formation to procede. It is generally accepted that dislocations, generated either by cold-work or irradiation, act as the preferential sinks.During irradiation in the high voltage electron microscope, both interstitials and vacancies are lost to foil surfaces and corresponding denuded zones are set up. As a result of image forces, dislocation loops formed upon irradiation tend to unfault and glide out of the foil. Thus, below a given thickness, the foil is unable to maintain a sufficiently high dislocation density to support void nucleation and growth.

A New 1,000 kV Electron Microscope

1967 ◽  
Vol 25 ◽  
pp. 260-261
Author(s):  
M. Nishigaki ◽  
S. Katagiri ◽  
H. Kimura ◽  
B. Tadano
Keyword(s):  
Electron Microscope ◽  
High Voltage ◽  
Basic Research ◽  
Chromatic Aberration ◽  
High Accuracy ◽  
Biological Specimen ◽  
Voltage Electron ◽  
High Voltage Electron Microscope ◽  
High Voltage Electron

The high voltage electron microscope has many advantageous features in comparison with the ordinary electron microscope. They are a higher penetrating efficiency of the electron, low chromatic aberration, high accuracy of the selected area diffraction and so on. Thus, the high voltage electron microscope becomes an indispensable instrument for the metallurgical, polymer and biological specimen studies. The application of the instrument involves today not only basic research but routine survey in the various fields. Particularly for the latter purpose, the performance, maintenance and reliability of the microscope should be same as those of commercial ones. The authors completed a 500 kV electron microscope in 1964 and a 1,000 kV one in 1966 taking these points into consideration. The construction of our 1,000 kV electron microscope is described below.

Design of Sensitive Photographic Materials for the High-Voltage Electron Microscope

1975 ◽  
Vol 33 ◽  
pp. 156-157
Author(s):  
Murray Vernon King ◽  
Donald F. Parsons
Keyword(s):  
Electron Microscope ◽  
Radiation Damage ◽  
High Voltage ◽  
Radiation Sensitivity ◽  
Fast Electrons ◽  
Voltage Electron ◽  
High Voltage Electron Microscope ◽  
High Voltage Electron ◽  
Biological Studies ◽  
Low Sensitivity

Effective application of the high-voltage electron microscope to a wide variety of biological studies has been restricted by the radiation sensitivity of biological systems. The problem of radiation damage has been recognized as a serious factor influencing the amount of information attainable from biological specimens in electron microscopy at conventional voltages around 100 kV. The problem proves to be even more severe at higher voltages around 1 MV. In this range, the problem is the relatively low sensitivity of the existing recording media, which entails inordinately long exposures that give rise to severe radiation damage. This low sensitivity arises from the small linear energy transfer for fast electrons. Few developable grains are created in the emulsion per electron, while most of the energy of the electrons is wasted in the film base.

In-situ electrical-resistivity measurements in the high-voltage electron microscope

1978 ◽  
Vol 36 (1) ◽  
pp. 68-69
Author(s):  
W. E. King
Keyword(s):  
Electrical Resistivity ◽  
Electron Microscope ◽  
High Voltage ◽  
Resistivity Measurements ◽  
Voltage Electron ◽  
High Voltage Electron Microscope ◽  
High Voltage Electron ◽  
Wide Range ◽  
Helium Gas

A side-entry type, helium-temperature specimen stage that has the capability of in-situ electrical-resistivity measurements has been designed and developed for use in the AEI-EM7 1200-kV electron microscope at Argonne National Laboratory. The electrical-resistivity measurements complement the high-voltage electron microscope (HVEM) to yield a unique opportunity to investigate defect production in metals by electron irradiation over a wide range of defect concentrations.A flow cryostat that uses helium gas as a coolant is employed to attain and maintain any specified temperature between 10 and 300 K. The helium gas coolant eliminates the vibrations that arise from boiling liquid helium and the temperature instabilities due to alternating heat-transfer mechanisms in the two-phase temperature regime (4.215 K). Figure 1 shows a schematic view of the liquid/gaseous helium transfer system. A liquid-gas mixture can be used for fast cooldown. The cold tip of the transfer tube is inserted coincident with the tilt axis of the specimen stage, and the end of the coolant flow tube is positioned without contact within the heat exchanger of the copper specimen block (Fig. 2).

Solute redistribution during in-situ irradiation of alloys in the high voltage electron microscope

1978 ◽  
Vol 36 (1) ◽  
pp. 370-371
Author(s):  
P. R. Okamoto ◽  
N.Q. Lam ◽  
R. L. Lyles
Keyword(s):  
Electron Microscope ◽  
High Voltage ◽  
Driving Forces ◽  
Solute Diffusion ◽  
Solute Redistribution ◽  
Voltage Electron ◽  
High Voltage Electron Microscope ◽  
High Voltage Electron ◽  
Thin Foils ◽  
Solute Atoms

During irradiation of thin foils in a high voltage electron microscope (HVEM) defect gradients will be set up between the foil surfaces and interior. In alloys defect gradients provide additional driving forces for solute diffusion since any preferential binding and/or exchange between solute atoms and mobile defects will couple a net flux of solute atoms to the defect fluxes. Thus, during irradiation large nonequilibrium compositional gradients can be produced near the foil surfaces in initially homogeneous alloys. A system of coupled reaction-rate and diffusion equations describing the build up of mobile defects and solute redistribution in thin foils and in a semi-infinite medium under charged-particle irradiation has been formulated. Spatially uniform and nonuniform damage production rates have been used to model solute segregation under electron and ion irradiation conditions.An example calculation showing the time evolution of the solute concentration in a 2000 Å thick foil during electron irradiation is shown in Fig. 1.

The Network Parameters Of The T-System In Frog Muscle Measured With The High Voltage Electron Microscope.

1975 ◽  
Vol 33 ◽  
pp. 550-551 ◽  
Author(s):  
Brenda R. Eisenberg ◽  
Lee D. Peachey
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
High Voltage ◽  
Sartorius Muscle ◽  
High Voltage Electron Microscopy ◽  
Network Parameters ◽  
Voltage Electron ◽  
High Voltage Electron Microscope ◽  
High Voltage Electron ◽  
T System

Analysis of the electrical properties of the t-system requires knowledge of the geometry of the t-system network. It is now possible to determine the network parameters experimentally by use of high voltage electron microscopy. The t-system was marked with exogenous peroxidase. Conventional methods of electron microscopy were used to fix and embed the sartorius muscle from four frogs. Transverse slices 0.5-1.0 μm thick were viewed at an accelerating voltage of 1000 kV using the JEM-1000 high voltage electron microscope at Boulder, Colorado and prints at x5000 were used for analysis.The length of a t-branch (t) from node to node (Fig. 1a) was measured with a magnifier; at least 150 t-branches around 30 myofibrils were measured from each frog. The mean length of t is 0.90 ± 0.11 μm and the number of branches per myofibril is 5.4 ± 0.2 (mean ± SD, n = 4 frogs).

Sign in / Sign up

Export Citation Format

Share Document