void formation
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2021 ◽  
Vol ahead-of-print (ahead-of-print) ◽  
Author(s):  
Fei Chong Ng ◽  
Aizat Abas ◽  
Muhammad Naqib Nashrudin ◽  
M. Yusuf Tura Ali

Purpose This paper aims to study the filling progression of underfill flow and void formation during the flip-chip encapsulation process. Design/methodology/approach A new parameter of filling progression that relates volume fraction filled to filling displacement was formulated analytically. Another indicative parameter of filling efficiency was also introduced to quantify the voiding fraction in filling progression. Additionally, the underfill process on different flip-chips based on the past experiments was numerically simulated. Findings All findings were well-validated with reference to the past experimental results, in terms of quantitative filling progression and qualitative flow profiles. The volume fraction filled increases monotonically with the filling displacement and thus the filling time. As the underfill fluid advances, the size of the void decreases while the filling efficiency increases. Furthermore, the void formed during the underfilling flow stage was caused by the accelerated contact line jump at the bump entrance. Practical implications The filling progression enabled manufacturers to forecast the underfill flow front, as it advances through the flip-chip. Moreover, filling progression and filling efficiency could provide quantitative insights for the determination of void formations at any filling stages. The voiding formation mechanism enables the prompt formulation of countermeasures. Originality/value Both the filling progression and filling efficiency are new indicative parameters in quantifying the performance of the filling process while considering the reliability defects such as incomplete filling and voiding.


Materials ◽  
2021 ◽  
Vol 14 (22) ◽  
pp. 6940
Author(s):  
Agnieszka Elżbieta Kochmańska ◽  
Aneta Jarlaczyńska ◽  
Jolanta Baranowska

New slurry cementation method was used to produce silicide and silicide-aluminide protective coatings on molybdenum alloy (TZM). The slurry cementation processes were carried out at a temperature of 1000 °C in different time intervals with the use of varied slurry mass values. The microstructure and thickness of the coatings were studied by means of scanning microscopy. Chemical composition using X-ray microanalysis and phase composition using X-ray diffraction were also investigated. Coating microhardness was determined. The obtained coatings had a multilayer structure. Phases from the Al-Si-Mo system were observed in silicide-aluminide coatings and phases from the Si-Mo system were observed in silicide coatings. The microhardness strongly depended on the phase composition of the coating. It was demonstrated that slurry mass values had an important influence on the morphology and growth kinetics of silicide-aluminide coatings. In the case of a small amount of the slurry, the deficiency of alloying elements occurring during long processes reduces growth kinetics and can lead to void formation in the structure of silicide-aluminide coatings.


2021 ◽  
pp. 2102283
Author(s):  
Hanghang Yan ◽  
Karnpiwat Tantratian ◽  
Kevin Ellwood ◽  
Elisa T. Harrison ◽  
Mark Nichols ◽  
...  

2021 ◽  
Vol 127 (12) ◽  
Author(s):  
Shun Sato ◽  
Hirofumi Hidai ◽  
Souta Matsusaka ◽  
Akira Chiba ◽  
Noboru Morita

2021 ◽  
Vol ahead-of-print (ahead-of-print) ◽  
Author(s):  
Yanruoyue Li ◽  
Guicui Fu ◽  
Bo Wan ◽  
Zhaoxi Wu ◽  
Xiaojun Yan ◽  
...  

Purpose The purpose of this study is to investigate the effect of electrical and thermal stresses on the void formation of the Sn3.0Ag0.5Cu (SAC305) lead-free ball grid array (BGA) solder joints and to propose a modified mean-time-to-failure (MTTF) equation when joints are subjected to coupling stress. Design/methodology/approach The samples of the BGA package were subjected to a migration test at different currents and temperatures. Voltage variation was recorded for analysis. Scanning electron microscope and electron back-scattered diffraction were applied to achieve the micromorphological observations. Additionally, the experimental and simulation results were combined to fit the modified model parameters. Findings Voids appeared at the corner of the cathode. The resistance of the daisy chain increased. Two stages of resistance variation were confirmed. The crystal lattice orientation rotated and became consistent and ordered. Electrical and thermal stresses had an impact on the void formation. As the current density and temperature increased, the void increased. The lifetime of the solder joint decreased as the electrical and thermal stresses increased. A modified MTTF model was proposed and its parameters were confirmed by theoretical derivation and test data fitting. Originality/value This study focuses on the effects of coupling stress on the void formation of the SAC305 BGA solder joint. The microstructure and macroscopic performance were studied to identify the effects of different stresses with the use of a variety of analytical methods. The modified MTTF model was constructed for application to SAC305 BGA solder joints. It was found suitable for larger current densities and larger influences of Joule heating and for the welding ball structure with current crowding.


2021 ◽  
Vol 11 (3) ◽  
pp. 130-139
Author(s):  
Mikhail Drapalyuk ◽  
Nikita Ushakov ◽  
Nikolai Jujukin ◽  
Aleksey Zhuravlev

The analysis of sowing methods and existing types of seeders, which are used in forestry and agrotechnical complexes, as well as patent materials, is given. Analysis of domestic designs of SLP-M, SLU-5-20 and "Litva-25" seeders, intended for sowing small forest seeds in nurseries and open ground, showed that they are energy-intensive and do not always ensure the embedding of seeds in moist soil. The perspective directions of resource conservation in agriculture have been considered: sowing using "no-till" or "mini-do" technology, ensuring sowing of seeds in untreated and minimally cultivated soil. The combined seeder AGRATORDK is equipped with a disc cultivator and a seeder with gouters. The RAPIDRDA-450S seeder from VADERSTAD has spherical discs that cultivate soil in one pass. The presented methods of sowing and seeding devices have a significant drawback - the necessity of additional working bodies with a high probability of getting into the grooves of dry soil, moving the top layer of soil "back and forth." A gouter which can change the angle of entering the soil and planting depths of small forest seeds was developed. Preliminary laboratory studies have shown the operability of gouter mock-up specimen and the ability to cut the seed furrow by cutting out a layer of soil with void formation above the bottom of the seed furrow, into which seeds were fed through tubes from funnels. The seeds were embedded with a layer of soil under the influence of its own gravity


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