scholarly journals High-frequency profile in adolescents and its relationship with the use of personal stereo devices

2016 ◽  
Vol 92 (2) ◽  
pp. 206-211 ◽  
Author(s):  
Renata Almeida Araújo Silvestre ◽  
Ângela Ribas ◽  
Rogério Hammerschmidt ◽  
Adriana Bender Moreira de Lacerda
2020 ◽  
Author(s):  
B Laufer ◽  
Paul Nation

This article shows that if there is some control over genre then there will be a close correspondence between the vocabulary size of intermediate learners as reflected in their writing and a more direct measure of vocabulary size The study proposes a new measure of lexical richness, the Lexical Frequency Profile, which looks at the proportion of high frequency general service and academic words in learners' writing The study shows that it is possible to obtain a reliable measure of lexical richness which is stable across two pieces of writing by the same learners It also discriminates between learners of different proficiency levels For learners of English as a second language, the Lexical Frequency Profile is seen as being a measure of how vocabulary size is reflected in use In this study, it was found that the Lexical Frequency Profile correlates well with an independent measure of vocabulary size This reliable and valid measure of lexical richness in writing will be useful for determining the factors that affect judgements of quality in writing and will be useful for examining how vocabulary growth is related to vocabulary use. © 1995 Oxford University Press.


2020 ◽  
Author(s):  
B Laufer ◽  
Paul Nation

This article shows that if there is some control over genre then there will be a close correspondence between the vocabulary size of intermediate learners as reflected in their writing and a more direct measure of vocabulary size The study proposes a new measure of lexical richness, the Lexical Frequency Profile, which looks at the proportion of high frequency general service and academic words in learners' writing The study shows that it is possible to obtain a reliable measure of lexical richness which is stable across two pieces of writing by the same learners It also discriminates between learners of different proficiency levels For learners of English as a second language, the Lexical Frequency Profile is seen as being a measure of how vocabulary size is reflected in use In this study, it was found that the Lexical Frequency Profile correlates well with an independent measure of vocabulary size This reliable and valid measure of lexical richness in writing will be useful for determining the factors that affect judgements of quality in writing and will be useful for examining how vocabulary growth is related to vocabulary use. © 1995 Oxford University Press.


1983 ◽  
Vol 31 (5) ◽  
pp. 804-808 ◽  
Author(s):  
D. Ge ◽  
D. Jaggard ◽  
H. Kritikos

1971 ◽  
Vol 26 (8) ◽  
pp. 1360-1365
Author(s):  
Günter H. ◽  
Klaus G. Fischer

Starting from the exact formulation of the electric microfield distribution in an electron gas the question is investigated of whether collective phenomena are correctly included in previous calculations. Application of Böhm and Pines' procedure yields a separable expression for the total microfield distribution: the collective component is represented by a Gaussian distribution, the individual component is similar to the high-frequency profile of Baranger and Mozer. Both components vary with the cut-off parameter of the spectrum of the collective modes. For realistic values of this cut-off parameter the total distribution may differ from the high-frequency profile as much as ten per cent for systems close to the critical density. With increasing plasma parameter Λ the distribution approaches that of Holtsmark


2016 ◽  
Vol 92 (2) ◽  
pp. 206-211
Author(s):  
Renata Almeida Araújo Silvestre ◽  
Ângela Ribas ◽  
Rogério Hammerschmidt ◽  
Adriana Bender Moreira de Lacerda

2020 ◽  
Vol 7 (2) ◽  
pp. 7-22
Author(s):  
Sergei Liapin

To characterize the rhythm of stresses in a line of Russian iambic tetrameter, a frequency profile is often used, i. e., a diagram of the occurrence of real stresses on all feet (ictuses) of the verse line. This article discusses in detail one of the mechanisms that enables the speech factor to influence the formation of the stress profile. It is shown that in Russian iambic tetrameter of the nineteenth and twentieth centuries, the high frequency of stresses of the second ictus is explained by the fact that the beginning of the line more often than not coincides with the beginning of a sentence or clause, and the Russian syntagma is more frequently stressed in the middle. And vice versa, wherever the frequency of enjambments increases, the second ictus is less frequently stressed, because the beginning of the syntagma moves to the middle of the line. Considering the above, the author attempts to characterize the peculiarity of the rhythmic structure of Russian iambic tetrameter in synchronic and diachronic aspects and reveal some major large-scale trends such as the growth of the rhythmic diversity of poetic texts.


Author(s):  
W. E. Lee ◽  
A. H. Heuer

IntroductionTraditional steatite ceramics, made by firing (vitrifying) hydrous magnesium silicate, have long been used as insulators for high frequency applications due to their excellent mechanical and electrical properties. Early x-ray and optical analysis of steatites showed that they were composed largely of protoenstatite (MgSiO3) in a glassy matrix. Recent studies of enstatite-containing glass ceramics have revived interest in the polymorphism of enstatite. Three polymorphs exist, two with orthorhombic and one with monoclinic symmetry (ortho, proto and clino enstatite, respectively). Steatite ceramics are of particular interest a they contain the normally unstable high-temperature polymorph, protoenstatite.Experimental3mm diameter discs cut from steatite rods (∼10” long and 0.5” dia.) were ground, polished, dimpled, and ion-thinned to electron transparency using 6KV Argon ions at a beam current of 1 x 10-3 A and a 12° angle of incidence. The discs were coated with carbon prior to TEM examination to minimize charging effects.


Author(s):  
G. Y. Fan ◽  
J. M. Cowley

It is well known that the structure information on the specimen is not always faithfully transferred through the electron microscope. Firstly, the spatial frequency spectrum is modulated by the transfer function (TF) at the focal plane. Secondly, the spectrum suffers high frequency cut-off by the aperture (or effectively damping terms such as chromatic aberration). While these do not have essential effect on imaging crystal periodicity as long as the low order Bragg spots are inside the aperture, although the contrast may be reversed, they may change the appearance of images of amorphous materials completely. Because the spectrum of amorphous materials is continuous, modulation of it emphasizes some components while weakening others. Especially the cut-off of high frequency components, which contribute to amorphous image just as strongly as low frequency components can have a fundamental effect. This can be illustrated through computer simulation. Imaging of a whitenoise object with an electron microscope without TF limitation gives Fig. 1a, which is obtained by Fourier transformation of a constant amplitude combined with random phases generated by computer.


Author(s):  
M. T. Postek ◽  
A. E. Vladar

Fully automated or semi-automated scanning electron microscopes (SEM) are now commonly used in semiconductor production and other forms of manufacturing. The industry requires that an automated instrument must be routinely capable of 5 nm resolution (or better) at 1.0 kV accelerating voltage for the measurement of nominal 0.25-0.35 micrometer semiconductor critical dimensions. Testing and proving that the instrument is performing at this level on a day-by-day basis is an industry need and concern which has been the object of a study at NIST and the fundamentals and results are discussed in this paper.In scanning electron microscopy, two of the most important instrument parameters are the size and shape of the primary electron beam and any image taken in a scanning electron microscope is the result of the sample and electron probe interaction. The low frequency changes in the video signal, collected from the sample, contains information about the larger features and the high frequency changes carry information of finer details. The sharper the image, the larger the number of high frequency components making up that image. Fast Fourier Transform (FFT) analysis of an SEM image can be employed to provide qualitiative and ultimately quantitative information regarding the SEM image quality.


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