Application of Scanning Probe Microscopy Techniques for Structural and
Electrical Characterization of Dielectrics, Carbon Nanotubes and
Nanoelectronic Devices
2019 ◽
Vol 11
(3)
◽
pp. 301-315
◽
2019 ◽
Vol 10
(1)
◽
pp. 129-140
2001 ◽
Vol 4
(1-3)
◽
pp. 71-76
◽
P. De Wolf
◽
E. Brazel
◽
A. Erickson
2017 ◽
Vol 256
◽
pp. 012018
◽
D V Sokolov
◽
N A Davletkildeev
◽
V V Bolotov
◽
I A Lobov
Stefan A. L. Weber
◽
Hans-Jürgen Butt
◽
Rüdiger Berger
2020 ◽
Vol 334
◽
pp. 135553
◽
Zhongting Wang
◽
Masashi Kotobuki
◽
Li Lu
◽
Kaiyang Zeng
2013 ◽
Vol 53
(9-11)
◽
pp. 1430-1433
◽
Alexander Hofer
◽
Roland Biberger
◽
Günther Benstetter
◽
Björn Wilke
◽
Holger Göbel
2015 ◽
Vol 356
◽
pp. 921-926
◽
Tobias Berthold
◽
Guenther Benstetter
◽
Werner Frammelsberger
◽
Rosana Rodríguez
◽
Montserrat Nafría
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