An investigation of drain pulse induced hot carrier degradation in n-type low temperature polycrystalline silicon thin film transistors

Meng Zhang; Mingxiang Wang

doi:10.1016/j.microrel.2010.01.024

An investigation of drain pulse induced hot carrier degradation in n-type low temperature polycrystalline silicon thin film transistors

Microelectronics Reliability ◽

10.1016/j.microrel.2010.01.024 ◽

2010 ◽

Vol 50 (5) ◽

pp. 713-716 ◽

Cited By ~ 10

Author(s):

Meng Zhang ◽

Mingxiang Wang

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Silicon Thin Film ◽

Hot Carrier ◽

Hot Carrier Degradation

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Hot-Carrier Degradation and Electric Field and Electron Concentration near Drain Junction in Low-Temperature N-Channel Single Drain and Lightly Doped Drain Polycrystalline Silicon Thin Film Transistors

Japanese Journal of Applied Physics ◽

10.1143/jjap.46.1322 ◽

2007 ◽

Vol 46 (3B) ◽

pp. 1322-1327 ◽

Cited By ~ 5

Author(s):

Gen Usami ◽

Yukisato Nogami ◽

Toshihisa Yajima ◽

Masahiro Yamagata ◽

Toshifumi Satoh ◽

...

Keyword(s):

Thin Film ◽

Low Temperature ◽

Electric Field ◽

Electron Concentration ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Silicon Thin Film ◽

Hot Carrier ◽

Lightly Doped Drain ◽

Hot Carrier Degradation

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Hot carrier degradation in low temperature processed polycrystalline silicon thin film transistors

Semiconductor Science and Technology ◽

10.1088/0268-1242/7/9/007 ◽

1992 ◽

Vol 7 (9) ◽

pp. 1183-1188 ◽

Cited By ~ 24

Author(s):

N D Young ◽

A Gill ◽

M J Edwards

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Silicon Thin Film ◽

Hot Carrier ◽

Hot Carrier Degradation

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Grain-Boundary Related Hot Carrier Degradation Mechanism in Low-Temperature Polycrystalline Silicon Thin-Film Transistors

Japanese Journal of Applied Physics ◽

10.1143/jjap.42.1999 ◽

2003 ◽

Vol 42 (Part 1, No. 4B) ◽

pp. 1999-2003 ◽

Cited By ~ 14

Author(s):

Toshiyuki Yoshida ◽

Yoshiki Ebiko ◽

Michiko Takei ◽

Nobuo Sasaki ◽

Toshiaki Tsuchiya

Keyword(s):

Thin Film ◽

Low Temperature ◽

Grain Boundary ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Degradation Mechanism ◽

Silicon Thin Film ◽

Hot Carrier ◽

Hot Carrier Degradation

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Effective density-of-states distribution of polycrystalline silicon thin-film transistors under hot-carrier degradation

Journal of Applied Physics ◽

10.1063/1.2777804 ◽

2007 ◽

Vol 102 (5) ◽

pp. 054508 ◽

Cited By ~ 15

Author(s):

Ming-Hsien Lee ◽

Kai-Hsiang Chang ◽

Horng-Chih Lin

Keyword(s):

Thin Film ◽

Density Of States ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Effective Density ◽

Silicon Thin Film ◽

Hot Carrier ◽

Hot Carrier Degradation

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Temperature Dependence of Performance and Hot-Carrier Immunity in Low-Temperature Polycrystalline Silicon Thin-Film Transistors

Japanese Journal of Applied Physics ◽

10.1143/jjap.49.084101 ◽

2010 ◽

Vol 49 (8) ◽

pp. 084101

Author(s):

Mieko Matsumura ◽

Yoshiaki Toyota ◽

Mutsuko Hatano ◽

Makoto Ohkura

Keyword(s):

Thin Film ◽

Low Temperature ◽

Temperature Dependence ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Silicon Thin Film ◽

Hot Carrier

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Hot-Carrier Degradation in Low-Temperature Polycrystalline Silicon n-Channel Lightly Doped Drain Thin-Film Transistors

Japanese Journal of Applied Physics ◽

10.1143/jjap.48.011207 ◽

2009 ◽

Vol 48 (1) ◽

pp. 011207 ◽

Cited By ~ 6

Author(s):

Seishiro Hirata ◽

Masahiro Yamagata ◽

Toshifumi Satoh ◽

Hiroyuki Tango

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Hot Carrier ◽

Lightly Doped Drain ◽

Hot Carrier Degradation

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Hot-Carrier-Induced Degradation under Current Saturation Bias in p-Channel Low-Temperature Polycrystalline Silicon Thin-Film Transistors

Japanese Journal of Applied Physics ◽

10.1143/jjap.46.5044 ◽

2007 ◽

Vol 46 (8A) ◽

pp. 5044-5049 ◽

Cited By ~ 3

Author(s):

Masahiro Yamagata ◽

Toshifumi Satoh ◽

Hiroyuki Tango

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Silicon Thin Film ◽

Hot Carrier ◽

Current Saturation

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Hot Carrier Induced Degradation in the Low Temperature Processed Polycrystalline Silicon Thin Film Transistors Using the Dynamic Stress

Japanese Journal of Applied Physics ◽

10.1143/jjap.41.1941 ◽

2002 ◽

Vol 41 (Part 1, No. 4A) ◽

pp. 1941-1946 ◽

Cited By ~ 13

Author(s):

Kow Ming Chang ◽

Yuan Hung Chung ◽

Gin Ming Lin

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Dynamic Stress ◽

Silicon Thin Film ◽

Hot Carrier

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Influences of Grain Boundaries on Temperature Dependence of Device Characteristics and on Hot Carrier Effects in Low-Temperature Polycrystalline Silicon Thin Film Transistors Containing Large Grains

Japanese Journal of Applied Physics ◽

10.1143/jjap.46.1312 ◽

2007 ◽

Vol 46 (3B) ◽

pp. 1312-1317

Author(s):

Toshiaki Tsuchiya ◽

Takafumi Miura ◽

Tsubasa Yamai ◽

Genshiro Kawachi ◽

Masakiyo Matsumura

Keyword(s):

Thin Film ◽

Low Temperature ◽

Temperature Dependence ◽

Grain Boundaries ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Silicon Thin Film ◽

Hot Carrier ◽

Hot Carrier Effects

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Pixel-Level Digital-to-Analog Conversion Scheme for Compact Data Drivers of Active Matrix Organic Light-Emitting Diodes with Low-Temperature Polycrystalline Silicon Thin-Film Transistors

Japanese Journal of Applied Physics ◽

10.1143/jjap.49.03cd03 ◽

2010 ◽

Vol 49 (3) ◽

pp. 03CD03 ◽

Cited By ~ 7

Author(s):

Tae-Wook Kim ◽

Byong-Deok Choi

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Organic Light Emitting Diodes ◽

Silicon Thin Film ◽

Active Matrix ◽

Light Emitting ◽

Organic Light ◽

Conversion Scheme

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