Electrical characterization of single cell in microfluidic device

2011 ◽  
Vol 51 (4) ◽  
pp. 781-789 ◽  
Author(s):  
Jen-Yu Jao ◽  
Chia-Feng Liu ◽  
Ming-Kun Chen ◽  
Ya-Chun Chuang ◽  
Ling-Sheng Jang
Keyword(s):  
Single Cell ◽  
Microfluidic Device ◽  
Electrical Characterization

Electrical characterization of a single cell electroporation biochip with the 2-D scanning vibrating electrode technology

2009 ◽  
Vol 11 (6) ◽  
pp. 1239-1250 ◽  
Author(s):  
Aeraj ul Haque ◽  
Mahvash Zuberi ◽  
Ruben E. Diaz-Rivera ◽  
D. Marshall Porterfield
Keyword(s):  
Single Cell ◽  
Electrical Characterization ◽  
Cell Electroporation ◽  
Single Cell Electroporation

Development of Microfluidic Device for Electrical/Physical Characterization of Single Cell

2006 ◽  
Vol 15 (2) ◽  
pp. 287-295 ◽  
Author(s):  
Y.H. Cho ◽  
T. Yamamoto ◽  
Y. Sakai ◽  
T. Fujii ◽  
B. Kim
Keyword(s):  
Single Cell ◽  
Microfluidic Device ◽  
Physical Characterization

scholarly journals Characterization of cell lysis events on a microfluidic device for high-throughput single cell analysis

2011 ◽  
Vol 32 (22) ◽  
pp. 3172-3179 ◽  
Author(s):  
Amy D. Hargis ◽  
Jean Pierre Alarie ◽  
John Michael Ramsey
Keyword(s):  
Single Cell ◽  
Microfluidic Device ◽  
High Throughput ◽  
Single Cell Analysis ◽  
Cell Lysis ◽  
Cell Analysis

Structural and Electrical Characterization of Shaped Beam Laser Recrystallized Polysilicon on Amorphous Substrates

1981 ◽  
Vol 4 ◽  
Author(s):  
T. J. Stultz ◽  
J. F. Gibbons
Keyword(s):  
Grain Size ◽  
Electrical Characterization ◽  
Grain Structure ◽  
Electrical Characteristics ◽  
Shaped Beam ◽  
Beam Laser ◽  
Cw Laser ◽  
Amorphous Substrates ◽  
Circular Beam

ABSTRACTStructural and electrical characterization of laser recrystallized LPCVD silicon films on amorphous substrates using a shaped cw laser beam have been performed. In comparing the results to data obtained using a circular beam, it was found that a significant increase in grain size can be achieved and that the surface morphology of the shaped beam recrystallized material was much smoother. It was also found that whereas circular beam recrystallized material has a random grain structure, shaped beam material is highly oriented with a <100> texture. Finally the electrical characteristics of the recrystallized film were very good when measured in directions parallel to the grain boundaries.

Vapor Deposition Polymerization and Electrical Characterization of TPD Thin Films

2011 ◽  
Vol E94-C (2) ◽  
pp. 157-163 ◽  
Author(s):  
Masakazu MUROYAMA ◽  
Ayako TAJIRI ◽  
Kyoko ICHIDA ◽  
Seiji YOKOKURA ◽  
Kuniaki TANAKA ◽  
...  
Keyword(s):  
Thin Films ◽  
Vapor Deposition ◽  
Electrical Characterization
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