Reliability modeling and analysis of flicker noise for pore structure in amorphous chalcogenide-based phase-change memory devices

2015 ◽  
Vol 55 (9-10) ◽  
pp. 1320-1322
Author(s):  
Jun Yeong Lim ◽  
Ilgu Yun
Keyword(s):  
Phase Change ◽  
Pore Structure ◽  
Flicker Noise ◽  
Phase Change Memory ◽  
Memory Devices ◽  
Reliability Modeling ◽  
Modeling And Analysis ◽  
Amorphous Chalcogenide ◽  
Change Memory

Analytical model for low-frequency noise in amorphous chalcogenide-based phase-change memory devices

2009 ◽  
Vol 106 (5) ◽  
pp. 054506 ◽  
Author(s):  
G. Betti Beneventi ◽  
A. Calderoni ◽  
P. Fantini ◽  
L. Larcher ◽  
P. Pavan
Keyword(s):  
Phase Change ◽  
Analytical Model ◽  
Phase Change Memory ◽  
Low Frequency ◽  
Frequency Noise ◽  
Memory Devices ◽  
Low Frequency Noise ◽  
Amorphous Chalcogenide ◽  
Change Memory

Precision of synaptic weights programmed in phase-change memory devices for deep learning inference

2020 ◽  
Author(s):  
S. R. Nandakumar ◽  
Irem Boybat ◽  
Jin-Ping Han ◽  
Stefano Ambrogio ◽  
Praneet Adusumilli ◽  
...  
Keyword(s):  
Deep Learning ◽  
Phase Change ◽  
Phase Change Memory ◽  
Memory Devices ◽  
Change Memory

Modeling of Atomic Migration Phenomena in Phase Change Memory Devices

2015 ◽  
Author(s):  
Luca Crespi ◽  
Andrea Lacaita ◽  
Mattia Boniardi ◽  
Enrico Varesi ◽  
Andrea Ghetti ◽  
...  
Keyword(s):  
Phase Change ◽  
Phase Change Memory ◽  
Memory Devices ◽  
Change Memory

Phase-change memory devices based on gallium-doped indium oxide

2009 ◽  
Vol 94 (11) ◽  
pp. 113503 ◽  
Author(s):  
S.-L. Wang ◽  
C.-Y. Chen ◽  
M.-K. Hsieh ◽  
W.-C. Lee ◽  
A. H. Kung ◽  
...  
Keyword(s):  
Phase Change ◽  
Indium Oxide ◽  
Phase Change Memory ◽  
Memory Devices ◽  
Change Memory

Holistic Integrated Process Solutions for Patterning Phase Change Memory Devices

2021 ◽  
Vol MA2021-01 (21) ◽  
pp. 846-846
Author(s):  
John Hoang ◽  
Meihua Shen ◽  
Thorsten Lill ◽  
Danna Qian ◽  
Aaron Routzahn ◽  
...  
Keyword(s):  
Phase Change ◽  
Phase Change Memory ◽  
Memory Devices ◽  
Integrated Process ◽  
Process Solutions ◽  
Change Memory

scholarly journals High Speed Test System of Current Pulse for Phase Change Memory Devices

2019 ◽  
Vol 1237 ◽  
pp. 042064
Author(s):  
Yuhan Wang ◽  
Ziqiang Zeng ◽  
Yuchan Wang ◽  
Xia Xu ◽  
Liangling Gu
Keyword(s):  
Phase Change ◽  
Current Pulse ◽  
High Speed ◽  
Phase Change Memory ◽  
Test System ◽  
Memory Devices ◽  
Speed Test ◽  
Change Memory

Scalable CGeSbTe-based phase change memory devices employing U-shaped cells

2017 ◽  
Vol 634 ◽  
pp. 141-146
Author(s):  
J.H. Park ◽  
J.H. Kim ◽  
D.-H. Ko ◽  
Z. Wu ◽  
D.H. Ahn ◽  
...  
Keyword(s):  
Phase Change ◽  
Phase Change Memory ◽  
Memory Devices ◽  
Change Memory
Sign in / Sign up

Export Citation Format

Share Document