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2015 IEEE International Memory Workshop (IMW)
Latest Publications
TOTAL DOCUMENTS
56
(FIVE YEARS 0)
H-INDEX
7
(FIVE YEARS 0)
Published By IEEE
9781467369312, 9781467369336
Latest Documents
Most Cited Documents
Contributed Authors
Related Sources
Related Keywords
Latest Documents
Most Cited Documents
Contributed Authors
Related Sources
Related Keywords
A Novel Approach to Identify the Carrier Transport Path and Its Correlation to the Current Variation in RRAM
2015 IEEE International Memory Workshop (IMW)
◽
10.1109/imw.2015.7150270
◽
2015
◽
Author(s):
Nianduan Lu
◽
Ling Li
◽
Pengxiao Sun
◽
Ming Wang
◽
Qi Liu
◽
...
Keyword(s):
Carrier Transport
◽
Novel Approach
◽
Current Variation
◽
Transport Path
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Modeling of Atomic Migration Phenomena in Phase Change Memory Devices
2015 IEEE International Memory Workshop (IMW)
◽
10.1109/imw.2015.7150296
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2015
◽
Cited By ~ 5
Author(s):
Luca Crespi
◽
Andrea Lacaita
◽
Mattia Boniardi
◽
Enrico Varesi
◽
Andrea Ghetti
◽
...
Keyword(s):
Phase Change
◽
Phase Change Memory
◽
Memory Devices
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Change Memory
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Characterization and Modeling of Advanced Placement Algorithms for NAND Flash Arrays
2015 IEEE International Memory Workshop (IMW)
◽
10.1109/imw.2015.7150279
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2015
◽
Author(s):
Carmine Miccoli
◽
Karthik Sarpatwari
◽
Domenico Di Cicco
◽
Mattia Cichocki
◽
Violante Moschiano
◽
...
Keyword(s):
Advanced Placement
◽
Nand Flash
◽
Placement Algorithms
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TCAD Simulation of Data Retention Characteristics of Charge Trap Device for 3-D NAND Flash Memory
2015 IEEE International Memory Workshop (IMW)
◽
10.1109/imw.2015.7150306
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2015
◽
Cited By ~ 6
Author(s):
Dongyean Oh
◽
Bonghoon Lee
◽
Eunmee Kwon
◽
Sangyong Kim
◽
Gyuseog Cho
◽
...
Keyword(s):
Flash Memory
◽
Nand Flash
◽
Nand Flash Memory
◽
Data Retention
◽
Charge Trap
◽
Retention Characteristics
◽
Tcad Simulation
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A Bulk Planar SiGe Quantum-Well Based ZRAM with Low Vt Variability
2015 IEEE International Memory Workshop (IMW)
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10.1109/imw.2015.7150268
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2015
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Author(s):
Sangya Dutta
◽
Sushant Mittal
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Saurabh Lodha
◽
Jorg Schulze
◽
Udayan Ganguly
Keyword(s):
Quantum Well
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Performance Characterization of LDPC Codes for Large-Volume NAND Flash Data
2015 IEEE International Memory Workshop (IMW)
◽
10.1109/imw.2015.7150301
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2015
◽
Cited By ~ 2
Author(s):
Patrick Khayat
◽
Mustafa Kaynak
◽
Sivagnanam Parthasarathy
◽
Saeed Sharifi Tehrani
Keyword(s):
Large Volume
◽
Ldpc Codes
◽
Nand Flash
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Performance Characterization
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Efficiently Realizing Weak Cell Aware DRAM Error Tolerance for Sub-20nm Technology Nodes
2015 IEEE International Memory Workshop (IMW)
◽
10.1109/imw.2015.7150283
◽
2015
◽
Author(s):
Hao Wang
◽
Kai Zhao
◽
Tong Zhang
Keyword(s):
Error Tolerance
◽
Technology Nodes
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Technology Trends and Near-Future Applications of Embedded STT-MRAM
2015 IEEE International Memory Workshop (IMW)
◽
10.1109/imw.2015.7150308
◽
2015
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Cited By ~ 6
Author(s):
Shinobu Fujita
◽
Hiroki Noguchi
◽
Kazutaka Ikegami
◽
Susumu Takeda
◽
Kumiko Nomura
◽
...
Keyword(s):
Near Future
◽
Technology Trends
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Comprehensive Methodology for ReRAM and Selector Design Guideline of Cross-point Array
2015 IEEE International Memory Workshop (IMW)
◽
10.1109/imw.2015.7150280
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2015
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Cited By ~ 6
Author(s):
Sangheon Lee
◽
Sooeun Lee
◽
Kibong Moon
◽
Jaehyuk Park
◽
Byungsub Kim
◽
...
Keyword(s):
Design Guideline
◽
Cross Point
Download Full-text
Summary of events
2015 IEEE International Memory Workshop (IMW)
◽
10.1109/imw.2015.7150261
◽
2015
◽
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