Simplification of sub-gap density of states extraction method for amorphous In-Ga-Zn-O thin-film transistors by a single capacitance-voltage curve
2018 ◽
Vol 83
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pp. 111-114
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2016 ◽
Vol 12
(9)
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pp. 888-891
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2012 ◽
Vol 33
(7)
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pp. 1015-1017
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2008 ◽
Vol 29
(12)
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pp. 1292-1295
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2010 ◽
Vol 31
(3)
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pp. 231-233
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2017 ◽
Vol 80
(1)
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pp. 10103
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