Capacitance–Voltage Measurement With Photon Probe to Quantify the Trap Density of States in Amorphous Thin-Film Transistors

2012 ◽  
Vol 33 (7) ◽  
pp. 1015-1017 ◽  
Author(s):  
Youn-Gyoung Chang ◽  
Hee Sung Lee ◽  
Kyunghee Choi ◽  
Seongil Im
Keyword(s):  
Thin Film ◽  
Density Of States ◽  
Thin Film Transistors ◽  
Trap Density ◽  
Voltage Measurement ◽  
Amorphous Thin Film ◽  
Capacitance Voltage

Interfacial Trap Density-of-States in Pentacene- and ZnO-Based Thin-Film Transistors Measured via Novel Photo-excited Charge-Collection Spectroscopy

2010 ◽  
Vol 22 (30) ◽  
pp. 3260-3265 ◽  
Author(s):  
Kimoon Lee ◽  
Min Suk Oh ◽  
Sung-jin Mun ◽  
Kwang H. Lee ◽  
Tae Woo Ha ◽  
...  
Keyword(s):  
Thin Film ◽  
Density Of States ◽  
Thin Film Transistors ◽  
Trap Density ◽  
Charge Collection

Trap Density of States Measured by Photon Probe on Amorphous-InGaZnO Thin-Film Transistors

2011 ◽  
Vol 32 (3) ◽  
pp. 336-338 ◽  
Author(s):  
Youn-Gyoung Chang ◽  
Dae-Hwan Kim ◽  
Gunwoo Ko ◽  
Kimoon Lee ◽  
Jae Hoon Kim ◽  
...  
Keyword(s):  
Thin Film ◽  
Density Of States ◽  
Thin Film Transistors ◽  
Trap Density ◽  
Amorphous Ingazno

Extraction of Subgap Density of States in Amorphous InGaZnO Thin-Film Transistors by Using Multifrequency Capacitance–Voltage Characteristics

2010 ◽  
Vol 31 (3) ◽  
pp. 231-233 ◽  
Author(s):  
Sangwon Lee ◽  
Sungwook Park ◽  
Sungchul Kim ◽  
Yongwoo Jeon ◽  
Kichan Jeon ◽  
...  
Keyword(s):  
Thin Film ◽  
Density Of States ◽  
Thin Film Transistors ◽  
Capacitance Voltage ◽  
Amorphous Ingazno

Impact of Interfacial Trap Density of States on the Stability of Amorphous InGaZnO-Based Thin-Film Transistors

2012 ◽  
Vol 29 (6) ◽  
pp. 067302 ◽  
Author(s):  
Xiao-Ming Huang ◽  
Chen-Fei Wu ◽  
Hai Lu ◽  
Qing-Yu Xu ◽  
Rong Zhang ◽  
...  
Keyword(s):  
Thin Film ◽  
Density Of States ◽  
Thin Film Transistors ◽  
Trap Density ◽  
The Stability ◽  
Amorphous Ingazno
Sign in / Sign up

Export Citation Format

Share Document