A probabilistic analysis technique for single event transient sensitivity evaluation of phase-lock-loops

2019 ◽  
Vol 100-101 ◽  
pp. 113436
Author(s):  
Li Duoli ◽  
Zeng Chuanbin ◽  
Dou Wei ◽  
Gao Linchun ◽  
Yan Weiwei ◽  
...  
Keyword(s):  
Probabilistic Analysis ◽  
Single Event ◽  
Single Event Transient ◽  
Phase Lock ◽  
Sensitivity Evaluation ◽  
Analysis Technique

Single-Event Transient Sensitivity Evaluation of Clock Networks at 28-nm CMOS Technology

2016 ◽  
Vol 63 (1) ◽  
pp. 385-391 ◽  
Author(s):  
H.-B. Wang ◽  
N. Mahatme ◽  
L. Chen ◽  
M. Newton ◽  
Y.-Q. Li ◽  
...  
Keyword(s):  
Cmos Technology ◽  
Single Event ◽  
Single Event Transient ◽  
Clock Networks ◽  
Sensitivity Evaluation ◽  
28 Nm

Pulsed Laser Stimulation Coupled with Optical Failure Analysis Technique—A Methodology to Help Space Application Electrical Designers

2015 ◽  
Author(s):  
G. Bascoul ◽  
K. Sanchez ◽  
G. Perez ◽  
F. Bezerra ◽  
H. Chauvin
Keyword(s):  
Heavy Ions ◽  
Pulsed Laser ◽  
Radiation Sensitivity ◽  
Radiation Environment ◽  
Physical Analysis ◽  
Space Application ◽  
Voltage Converter ◽  
Industrial Laboratory ◽  
Sensitivity Evaluation ◽  
Analysis Technique

Abstract Pulsed laser for radiation sensitivity evaluation has become a common tool used in research and industrial laboratory. This paper aims to highlight an approach to understand weaknesses of a component under radiation environment using a short pulsed width laser beam coupled to thermography technique, heavy ions test inputs and physical analysis. This paper is based on a study of a PWM device embedded on voltage converter.

Single Event Transient (SET) Mitigation Circuits with Immune Leaf Nodes

2021 ◽  
pp. 1-1
Author(s):  
Faisal Mustafa Sajjade ◽  
Neeraj Kumar Goyal ◽  
B.K.S.V.L Varaprasad
Keyword(s):  
Single Event ◽  
Single Event Transient
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