Radiation and annealing related effects in NBT stressed P-channel power VDMOSFETs

2021 ◽  
pp. 114273
Author(s):  
D. Danković ◽  
V. Davidović ◽  
S. Golubović ◽  
S. Veljković ◽  
N. Mitrović ◽  
...  
Keyword(s):  
2021 ◽  
Vol 157 ◽  
pp. 107291
Author(s):  
Chaofan Li ◽  
Qiliang Liu ◽  
Pin Zhou ◽  
Hongjun Huang

Atomic Energy ◽  
2011 ◽  
Vol 110 (2) ◽  
pp. 73-76 ◽  
Author(s):  
A. V. Krayushkin ◽  
L. N. Zakharova

1991 ◽  
Vol 1 (1) ◽  
pp. 39-58 ◽  
Author(s):  
J. David Lichtenthal

Author(s):  
Yajie Xin ◽  
Wanjun Chen ◽  
Ruize Sun ◽  
Xiaochuan Deng ◽  
Zhaoji Li ◽  
...  

2021 ◽  
Author(s):  
G. S. Ristic ◽  
A. S. Jevtic ◽  
S. D. Ilic ◽  
S. Dimitrijevic ◽  
S. Veljkovic ◽  
...  
Keyword(s):  

Sign in / Sign up

Export Citation Format

Share Document