Residual stress measurement with focused acoustic waves and direct comparison with X-ray diffraction stress measurements

2005 ◽  
Vol 399 (1-2) ◽  
pp. 84-91 ◽  
Author(s):  
Shamachary Sathish ◽  
Thomas J. Moran ◽  
Richard W. Martin ◽  
Richard Reibel
2015 ◽  
Vol 812 ◽  
pp. 303-308 ◽  
Author(s):  
David Cseh ◽  
Valeria Mertinger ◽  
Márton Benke

An innovative X-ray diffractometer especially designed for residual stress measurements was deployed at the Institute of Physical Metallurgy, Metalforming and Nanotechnology of the University of Miskolc. The advantages of the equipment over the traditional X-ray diffraction stress measuring methods are presented through our experiences on industrial components with varying sizes, geometries and measurement requirements. The microstructural limitations of the X-ray diffraction based residual stress measurement method are also discussed.


1985 ◽  
Vol 107 (2) ◽  
pp. 185-191 ◽  
Author(s):  
C. O. Ruud ◽  
R. N. Pangborn ◽  
P. S. DiMascio ◽  
D. J. Snoha

A unique X-ray diffraction instrument for residual stress measurement has been developed that provides for speed, ease of measurement, accuracy, and economy of surface stress measurement. Application of this instrument with a material removal technique, e.g., electropolishing, has facilitated detailed, high resolution studies of three-dimensional stress fields. This paper describes the instrumentation and techniques applied to conduct the residual stress measurement and presents maps of the residual stress data obtained for the surfaces of a heavy 2 1/4 Cr 1 Mo steel plate weldment.


2009 ◽  
Vol 2009.46 (0) ◽  
pp. 385-386
Author(s):  
Koji Hattori ◽  
Mitsuyoshi Nakatani ◽  
Tomoki Takehashi ◽  
Masamitsu Abe ◽  
Toshihiko Sasaki

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