Study of robin condition influence on phonon nano-heat conduction using meso-scale method in MOSFET and SOI-MOSFET devices
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2016 ◽
Vol 47
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pp. 310-321
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2019 ◽
Vol 212
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pp. 522-530
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2017 ◽
Vol 40
(14)
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pp. 5109-5130
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2018 ◽
Vol 188
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pp. 793-808
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2016 ◽
Vol 100
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pp. 362-377
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