In-situ synchrotron X-ray diffraction study of stress-induced phase transformation in Ti50.1Ni40.8Cu9.1 thin films
2012 ◽
Vol 407
(17)
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pp. 3437-3440
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2015 ◽
Vol 3
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pp. 11357-11365
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2005 ◽
Vol 244
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2013 ◽
Vol 97
(4)
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pp. 1256-1263
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2014 ◽
Vol 582
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pp. 360-363
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2011 ◽
Vol 116
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pp. 1401-1407
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