In situ X-ray diffraction study of crystallization process of GeSbTe thin films during heat treatment

2005 ◽  
Vol 244 (1-4) ◽  
pp. 281-284 ◽  
Author(s):  
Naohiko Kato ◽  
Ichiro Konomi ◽  
Yoshiki Seno ◽  
Tomoyoshi Motohiro
Keyword(s):  
Thin Films ◽  
Heat Treatment ◽  
Diffraction Study ◽  
Crystallization Process ◽  
X Ray Diffraction ◽  
X Ray

In situ X-ray diffraction study of the controlled oxidation and reduction in the V–O system for the synthesis of VO2 and V2O3 thin films

2015 ◽  
Vol 3 (43) ◽  
pp. 11357-11365 ◽  
Author(s):  
Geert Rampelberg ◽  
Bob De Schutter ◽  
Wouter Devulder ◽  
Koen Martens ◽  
Iuliana Radu ◽  
...  
Keyword(s):  
Thin Films ◽  
Diffraction Study ◽  
Resistance Switching ◽  
X Ray Diffraction ◽  
X Ray

VO2 and V2O3 thin films were prepared during in situ XRD investigation by oxidation and reduction of V and V2O5. Films show up to 5 orders of magnitude resistance switching.

In-situ x-ray diffraction study of the growth of highly strained epitaxial BaTiO3 thin films

2013 ◽  
Vol 103 (24) ◽  
pp. 242904 ◽  
Author(s):  
J. Sinsheimer ◽  
S. J. Callori ◽  
B. Ziegler ◽  
B. Bein ◽  
P. V. Chinta ◽  
...  
Keyword(s):  
Thin Films ◽  
Diffraction Study ◽  
X Ray Diffraction ◽  
X Ray ◽  
Highly Strained

In situ analysis of the crystallization process of Sb 2 S 3 thin films by Raman scattering and X-ray diffraction

2017 ◽  
Vol 121 ◽  
pp. 1-10 ◽  
Author(s):  
Romain Parize ◽  
Thomas Cossuet ◽  
Odette Chaix-Pluchery ◽  
Hervé Roussel ◽  
Estelle Appert ◽  
...  
Keyword(s):  
Thin Films ◽  
Raman Scattering ◽  
Crystallization Process ◽  
In Situ Analysis ◽  
X Ray Diffraction ◽  
X Ray

In-situ synchrotron X-ray diffraction study of stress-induced phase transformation in Ti50.1Ni40.8Cu9.1 thin films

2012 ◽  
Vol 407 (17) ◽  
pp. 3437-3440 ◽  
Author(s):  
H. Wang ◽  
G.A. Sun ◽  
B. Chen ◽  
Y.Q. Fu ◽  
X.L. Wang ◽  
...  
Keyword(s):  
Thin Films ◽  
Phase Transformation ◽  
Diffraction Study ◽  
X Ray Diffraction ◽  
X Ray

Effects of heat treatment and in situ high-temperature X-ray diffraction study on the formation of ferroelectric epitaxial Y-doped HfO2 film

2019 ◽  
Vol 58 (SB) ◽  
pp. SBBB09 ◽  
Author(s):  
Takanori Mimura ◽  
Takao Shimizu ◽  
Takanori Kiguchi ◽  
Akihiro Akama ◽  
Toyohiko J. Konno ◽  
...  
Keyword(s):  
Heat Treatment ◽  
High Temperature ◽  
Diffraction Study ◽  
X Ray Diffraction ◽  
Hfo2 Film ◽  
X Ray
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