scholarly journals Epitaxial strain effect in perovskite RENiO3 films (RE= La–Eu) prepared by metal organic decomposition

2014 ◽  
Vol 505 ◽  
pp. 24-31 ◽  
Author(s):  
Ai Ikeda ◽  
Takaaki Manabe ◽  
Michio Naito
1996 ◽  
Vol 444 ◽  
Author(s):  
Hyeon-Seag Kim ◽  
D. L. Polla ◽  
S. A. Campbell

AbstractThe electrical reliability properties of PZT (54/46) thin films have been measured for the purpose of integrating this material with silicon-based microelectromechanical systems. Ferroelectric thin films of PZT were prepared by metal organic decomposition. The charge trapping and degradation properties of these thin films were studied through device characteristics such as hysteresis loop, leakage current, fatigue, dielectric constant, capacitancevoltage, and loss factor measurements. Several unique experimental results have been found. Different degradation processes were verified through fatigue (bipolar stress), low and high charge injection (unipolar stress), and high field stressing (unipolar stress).


2018 ◽  
Vol 31 (4) ◽  
pp. 044004 ◽  
Author(s):  
Takanori Motoki ◽  
Shuhei Ikeda ◽  
Shin-ichi Nakamura ◽  
Genki Honda ◽  
Tatsuoki Nagaishi ◽  
...  

1998 ◽  
Vol 177-181 ◽  
pp. 1162-1163 ◽  
Author(s):  
M. Ciria ◽  
J.I. Arnaudas ◽  
A. del Moral ◽  
C. de la Fuente ◽  
R.C.C. Ward ◽  
...  

2016 ◽  
Vol 9 ◽  
pp. 529-534 ◽  
Author(s):  
Takumi Chikada ◽  
Teruya Tanaka ◽  
Kenta Yuyama ◽  
Yuki Uemura ◽  
Shodai Sakurada ◽  
...  

2005 ◽  
Vol 44 (12) ◽  
pp. 8451-8452 ◽  
Author(s):  
Qixin Guo ◽  
Yusuke Kume ◽  
Tooru Tanaka ◽  
Mitsuhiro Nishio ◽  
Hiroshi Ogawa ◽  
...  

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