Electrical and Structural Characterization of GaN p-n Heterostuctures by Scanning Probe Microscopy

Microscopy and Microanalysis ◽

10.1017/s1431927602107902 ◽

2002 ◽

Vol 8 (S02) ◽

pp. 1206-1207

Author(s):

M. I. N. da Silva ◽

J. C. González ◽

P. E. Russell

Keyword(s):

Structural Characterization ◽

Scanning Probe Microscopy ◽

Scanning Probe ◽

Probe Microscopy

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Characterization of periodically poled ferroelectric crystals using scanning probe microscopy

Technical Digest. Summaries of papers presented at the Conference on Lasers and Electro-Optics. Postconference Technical Digest (IEEE Cat. No.01CH37170) ◽

10.1109/cleo.2001.947615 ◽

2001 ◽

Author(s):

R. Clemens ◽

F. Laurell ◽

H. Karlsson ◽

J. Wittborn ◽

C. Canalias ◽

...

Keyword(s):

Scanning Probe Microscopy ◽

Scanning Probe ◽

Periodically Poled ◽

Probe Microscopy ◽

Ferroelectric Crystals

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Characterization of CVD-synthesized graphene films transferred on different substrates using the scanning probe microscopy electrical techniques

Physica E Low-dimensional Systems and Nanostructures ◽

10.1016/j.physe.2021.115101 ◽

2021 ◽

pp. 115101

Author(s):

Yu.V. Korkh ◽

A.B. Rinkevich ◽

A.S. Klepikova ◽

E.A. Tolmacheva ◽

E.A. Pankrushina

Keyword(s):

Scanning Probe Microscopy ◽

Scanning Probe ◽

Probe Microscopy ◽

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Scanning Probe Microscopy Characterization of Cluster Systems

Low-Dimensional Systems: Theory, Preparation, and Some Applications ◽

10.1007/978-94-010-0143-4_20 ◽

2003 ◽

pp. 253-265

Author(s):

Wanda Polewska ◽

Ryszard Czajka ◽

Jarosław Gutek ◽

T. Hihara ◽

A. Kasuya

Keyword(s):

Scanning Probe Microscopy ◽

Scanning Probe ◽

Cluster Systems ◽

Probe Microscopy ◽

Microscopy Characterization

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Characterization of thermally oxidized carbon fibre surfaces by ESCA, wetting techniques and scanning probe microscopy, and the interaction with polyethylmethacrylate. Development of a biocompatible composite material

10.1016/0010-4361(94)90213-5 ◽

1994 ◽

Vol 25 (7) ◽

pp. 763-769 ◽

Author(s):

J. Mayer ◽

S. Giorgetta ◽

B. Koch ◽

E. Wintermantel ◽

J. Patscheider ◽

...

Keyword(s):

Composite Material ◽

Carbon Fibre ◽

Scanning Probe Microscopy ◽

Scanning Probe ◽

Probe Microscopy ◽

Oxidized Carbon

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Electrical characterization of semiconductor nanowires by scanning-probe microscopy

Semiconductor Nanowires ◽

10.1016/b978-1-78242-253-2.00010-4 ◽

2015 ◽

pp. 277-304 ◽

Author(s):

T. Xu ◽

B. Grandidier

Keyword(s):

Scanning Probe Microscopy ◽

Electrical Characterization ◽

Semiconductor Nanowires ◽

Scanning Probe ◽

Probe Microscopy

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Characterization of Catalysts by Advanced Scanning Probe Microscopy and Spectroscopy

ChemCatChem ◽

10.1002/cctc.201901877 ◽

2020 ◽

Vol 12 (14) ◽

pp. 3601-3620

Author(s):

Yao Sun ◽

Kaiyang Zeng

Keyword(s):

Scanning Probe Microscopy ◽

Scanning Probe ◽

Probe Microscopy

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Nanoscale Characterization of CDC Supercapacitors by In Situ Scanning Probe Microscopy Methods

ECS Meeting Abstracts ◽

10.1149/ma2012-02/6/603 ◽

2012 ◽

Keyword(s):

Scanning Probe Microscopy ◽

Scanning Probe ◽

Probe Microscopy ◽

Nanoscale Characterization

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Nanoscale Characterization of Silicon-On-Insulator Nanowires by Multimode Scanning Probe Microscopy

Transactions of the Materials Research Society of Japan ◽

10.14723/tmrsj.38.265 ◽

2013 ◽

Vol 38 (2) ◽

pp. 265-268

Author(s):

Leonid Bolotov ◽

Tetsuya Tada ◽

Yukinori Morita ◽

Vladimir Poborchii ◽

Toshihiko Kanayama

Keyword(s):

Scanning Probe Microscopy ◽

Silicon On Insulator ◽

Scanning Probe ◽

Probe Microscopy ◽

Nanoscale Characterization

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Characterization of vertical RESURF diodes using scanning probe microscopy

Materials Science and Engineering B ◽

10.1016/s0921-5107(03)00021-7 ◽

2003 ◽

Vol 102 (1-3) ◽

pp. 143-147 ◽

Author(s):

N. Duhayon ◽

M. Xu ◽

W. Vandervorst ◽

L. Hellemans ◽

C. Rochefort ◽

...

Keyword(s):

Scanning Probe Microscopy ◽

Scanning Probe ◽

Probe Microscopy

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Electrical characterization of semiconductor materials and devices using scanning probe microscopy

Materials Science in Semiconductor Processing ◽

10.1016/s1369-8001(00)00174-8 ◽

2001 ◽

Vol 4 (1-3) ◽

pp. 71-76 ◽

Author(s):

P. De Wolf ◽

E. Brazel ◽

A. Erickson

Keyword(s):

Scanning Probe Microscopy ◽

Electrical Characterization ◽

Scanning Probe ◽

Semiconductor Materials ◽

Probe Microscopy

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