Does asymmetric charge transfer play an important role as an ionization mode in low power–low pressure glow discharge mass spectrometry?

2016 ◽  
Vol 118 ◽  
pp. 56-61 ◽  
Author(s):  
S. Mushtaq ◽  
E.B.M. Steers ◽  
G. Churchill ◽  
D. Barnhart ◽  
V. Hoffmann ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Charge Transfer ◽  
Glow Discharge ◽  
Low Power ◽  
Low Pressure ◽  
Glow Discharge Mass Spectrometry ◽  
Pressure Glow Discharge ◽  
Ionization Mode

scholarly journals Influence of polycrystalline material on crater shape optimization and roughness using low-power/low-pressure direct-current glow discharge mass spectrometry

2020 ◽  
Vol 35 (7) ◽  
pp. 1450-1457
Author(s):  
Gagan Paudel ◽  
Sergey Khromov ◽  
Martin Kasik ◽  
Hans Jørgen Roven ◽  
Marisa Di Sabatino
Keyword(s):  
Mass Spectrometry ◽  
Glow Discharge ◽  
Low Power ◽  
Shape Optimization ◽  
Direct Current ◽  
Polycrystalline Material ◽  
Low Pressure ◽  
Glow Discharge Mass Spectrometry ◽  
Crater Bottom ◽  
Crater Shape

It is likely that observation of roughness at crater bottom upon GDMS sputtering is due to differential sputtering of grains.

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