Portraying urban landscape: A quantitative analysis system applied in fifteen metropolises in China

A new method for the quantification of montmorillonite by full-profile Rietveld analysis of the XRD profile is presented. A measured standard XRD pattern of Algerian bentonite was used to construct a universally applicable montmorillonite (hkl) file for use with a P.C. based Rietveld XRD quantitative analysis system, SIROQUANT. “Universal” means that the standard file can be used for montmorillonites from other localities. The validity of the montmorillonite standard profile was tested with weighed mixtures of quartz and different standard montmorillonites. The results show the montmorillonite observed (hkl) file is generally applicable (i.e., universal), and can be used to quantify montmorillonite in any mineral without modification or chemical treatment of the sample. Two halfwidth functions were used for the montmorillonite, corresponding to the sharp (hk0) and broad (hkl) classes of reflections. A March preferred orientation parameter for montmorillonite was also refined.

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Technical Approach for Rehabilitation Medicine: Development of a Quantitative Analysis System for Voluntary Movement Functions in the Upper Limb.

The Japanese Journal of Rehabilitation Medicine ◽

10.2490/jjrm1963.39.735 ◽

2002 ◽

Vol 39 (11) ◽

pp. 735-743

Author(s):

Nobuki MURAYAMA

Keyword(s):

Quantitative Analysis ◽

Upper Limb ◽

Voluntary Movement ◽

Rehabilitation Medicine ◽

Technical Approach ◽

Medicine Development ◽

Analysis System

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Comparison of experimental and theoretical XEDS k-factors as a function of accelerating voltage

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100135903 ◽

1990 ◽

Vol 48 (2) ◽

pp. 460-461

Author(s):

Nestor J. Zaluzec

Keyword(s):

Quantitative Analysis ◽

Cross Section ◽

Ionization Cross Section ◽

Experimental Measurements ◽

Energy Dispersive Analysis ◽

Ionization Cross ◽

Medium Voltage ◽

K Factor ◽

Analysis System ◽

Lower Voltage

For nearly fifteen years k-factor measurements have been made by varying the composition of the standards at fixed accelerating voltage and measuring the change in the experimental k-factor with atomic number. From this data a “best model” of the ionization cross-section is frequently proposed for use in quantitative analysis, however it is valid only at that fixed voltage. Few if any studies seek to determine the systematic variation in the k-factor with accelerating voltage. In this paper experimental measurements of the variation in the k-factor as a function of accelerating voltage are reported. With the advent of medium voltage analytical microscopes routinely available to the microscopy community, it becomes essential to understand how the k-factor varies with accelerating voltage in order that errors in quantitative analysis can be avoided should experimental or theoretical k-factors from lower voltage instruments are applied to the medium voltage regime.Electropolished specimens of β-NiAl were studied in a Philips CM30T electron microscope, equipped with a Be-Window Si(Li) detector interfaced to an EDAX 9900 Energy Dispersive Analysis System.

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