Surface oxidation state of combustion-synthesized γ-Fe2O3 nanoparticles determined by electron energy loss spectroscopy in the transmission electron microscope

2005 ◽  
Vol 109 (1) ◽  
pp. 19-23 ◽  
Author(s):  
J. Jasinski ◽  
K.E. Pinkerton ◽  
I.M. Kennedy ◽  
V.J. Leppert
Keyword(s):  
Electron Microscope ◽  
Energy Loss ◽  
Electron Energy ◽  
Oxidation State ◽  
Transmission Electron Microscope ◽  
Electron Energy Loss Spectroscopy ◽  
Surface Oxidation ◽  
Fe2o3 Nanoparticles ◽  
Transmission Electron ◽  
Electron Energy Loss

Analysis of Biological Structures by Electron Energy Loss Spectroscopy and Imaging

2001 ◽  
Vol 7 (S2) ◽  
pp. 1166-1167
Author(s):  
R.D. Leapman ◽  
S.B. Andrews
Keyword(s):  
Electron Microscope ◽  
Energy Loss ◽  
Electron Energy ◽  
Transmission Electron Microscope ◽  
Electron Energy Loss Spectroscopy ◽  
Single Atom ◽  
Analytical Sensitivity ◽  
Transmission Electron ◽  
Biological Structures ◽  
Electron Energy Loss

As techniques for electron energy-loss spectroscopy (EELS) reach a higher degree of optimization, detection limits for analyzing biological structures are approaching those predicted by theory. in favorable specimens, single atom detection is predicted for elemental maps acquired by means of the scanning transmission electron microscope (STEM) equipped with a field emission source, paralleldetection EELS and a spectrum-imaging system. to obtain such results, the electron detector should have a detective quantum efficiency close to unity and a well behaved point-spread function; such design features are now available with a cooled charge-couple device (CCD) array. The energy-filtering transmission electron microscope (EFTEM) provides a complementary approach to mapping elements occurring at higher concentrations but distributed over larger regions of the specimen. Use of an optimized CCD detector in the EFTEM now enables accurate quantitation in addition to high analytical sensitivity, albeit not at the single atom level.

ELECTRON ENERGY LOSS SPECTROSCOPY AND ANNULAR DARK FIELD IMAGING AT A NANOMETER RESOLUTION IN A SCANNING TRANSMISSION ELECTRON MICROSCOPE

2000 ◽  
Vol 07 (04) ◽  
pp. 475-494 ◽  
Author(s):  
O. STÉPHAN ◽  
A. GLOTER ◽  
D. IMHOFF ◽  
M. KOCIAK ◽  
C. MORY ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Energy Loss ◽  
Electron Energy ◽  
Transmission Electron Microscope ◽  
Electron Energy Loss Spectroscopy ◽  
Scanning Transmission Electron Microscope ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Electron Energy Loss

The basics of electron energy loss spectroscopy (EELS) performed in the context of a scanning transmission electron microscope are described. This includes instrumentation, information contained in an EELS spectrum, data acquisition and processing, and some illustrations by a few examples.

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