scholarly journals Microcantilever arrays functionalised with spiropyran photoactive moieties as systems to measure photo-induced surface stress changes

2016 ◽  
Vol 237 ◽  
pp. 479-486 ◽  
Author(s):  
Catherine Grogan ◽  
Larisa Florea ◽  
Slavica Koprivica ◽  
Silvia Scarmagnani ◽  
Luke O’Neill ◽  
...  
Author(s):  
L. Florea ◽  
R. Raiteri ◽  
S. Koprivica ◽  
S. Scarmagnani ◽  
D. Diamond ◽  
...  

Author(s):  
Kyungho Kang ◽  
Pranav Shrotriya

Surface stress changes associated with hybridization of surface immobilized DNA molecules are measured. A novel interferometry technique employing two adjacent micromachined cantilevers a sensing/reference pair is used to measure the surface stress development. Measurement approach relies on coating the sensing cantilever with single stranded DNA (30-mer Adenine (poly A)) and reference cantilever with hybridized DNA. The sensing/reference pair is exposed to varying concentrations of complimentary DNA strand (30-mer Thymine (Poly T)) and differential deflection of sensing cantilever with respect to reference is measured to determine the change in surface stress. Experimental results indicate that surface stress develops only on exposure to complimentary strands (specific binding) and is not affected by exposure to other single stranded DNA (non-specific binding). Varying the poly T concentration from 0.1 to 1.0 μM results in a linear increase of the surface stress changes from 40 to 110 mN/m during DNA hybridization. Surface stress development starts as soon as the complementary poly T is introduced in the fluid cell and reaches a stable value within 15 minutes of injection time.


2021 ◽  
Author(s):  
Omid Memarian Sorkhabi

Abstract Understanding how the movement of faults and deformation affects such as motion-induced surface stress and strain, which is very important in seismic regions. The best way to learn about the effects of fault movement is modeled. For example, the modeling of surface displacement or deformation and the amount of damage earthquake can be estimated by the model. Coulomb stress changes can be modeled or predicted earthquake aftershocks or future Earthquakes. we employ assumptions on the orientations, rupture lengths and average slip associated with each earthquake to calculate stress changes. Using this model, we displacement, stress and strain at any depth in the Earth's surface acquired. In this study the modeling of earthquakes Mw= 6.5, Mw=6.3 Ahar-Varzaghan. The earthquakes induced displacements, strains and stresses were calculated at the surface at an average depth and its aftershocks for 10-km Ahar and 4 km Varzaghan.


Author(s):  
Kyungho Kang ◽  
Marit Nilsen-Hamilton ◽  
Pranav Shrotriya

A fiber optic coupled interferometric system designed to measure differential surface stress induced by DNA hybridization of (dA)30 single-stranded DNA (ssDNA) with complementary (dT)30 ssDNA in aqueous environment. The sensing system is amenable to miniaturize into a single MEMS-chip and performed direct detection of nanomechanical response of conformational change and the corresponding charge transduction during molecular adsorption. The static deflection of functionalized sensing cantilever respect to reference cantilever which passivated from additional target molecules converts into a surface stress change for quantitative analysis. The measured surface stress changes were turned to be 40 to 110 mN/m for the concentrations of 0.1 to 1.0 μM of target molecules associated with the dissociation constant (Kd) of 168 nM. X-ray photoelectron spectroscopy (XPS) analysis and noncomplementary experiments were also considered for the validity and reliability of the system.


2018 ◽  
Vol MA2018-01 (32) ◽  
pp. 1985-1985
Author(s):  
Gery R. Stafford ◽  
Ugo Bertocci

Wafer curvature and cantilever bending techniques have been used by the electrochemical community to examine stress development during electrochemical processing. Surface stress changes as low as 10−3 N/m can typically be resolved from cantilever electrodes immersed in solution and under potential control. Such resolution makes this measurement useful for examining virtually all aspects of electrochemistry; i.e., electrocapillarity, adsorption processes, underpotential deposition, electrodeposition, etc. Often these processes occur either simultaneously or in rapid succession and we are often limited to measuring the influence of the dominant process in the time-scale of the experiment. In the case of electrocapillarity (charge-induced stress), the figure of merit is the stress-charge coefficient (ς) which captures the fundamental surface mechanics associated with charging the electrode surface. It has been well documented in the literature that ς is influenced by the anion in solution and its concentration.1,2 However, a steady state measurement cannot separate the contributions of anion adsorption from that of simple capacitive charging. Similar to electrochemical impedance spectroscopy (EIS) where electrochemical processes with different characteristic time constants can be separated, dynamic stress analysis (DSA) allows us to study the dynamics of any particular stress-generating process and link the stress to specific electrochemical and surface phenomena. We have demonstrated the technique by examining the electrocapillarity of both Pt and Au in HClO4 electrolyte.3,4 ς can be obtained from the following equation, ς = jωYsZe where Ze is the electrochemical impedance, Ys is the stress admittance (with units of N/(V-m), ω is the angular frequency, and j =√-1. In order to include adsorbate-induced contributions to the surface stress, one considers an equivalent circuit that adequately describes both the double layer and adsorption contributions to the electrochemical impedance. One can then obtain unique stress-charge coefficients that capture both electrocapillarity and anion adsorption as a function of potential. This will be demonstrated using (111)-textured Au cantilever electrodes in both sulfate and perchlorate electrolyte. References W. Haiss, R.J. Nichols, J.K. Sass, and K.P. Charle, J. Electroanal. Chem., 452, 199, (1998). R.N. Viswanath, D. Kramer, and J. Weissmüller, Langmuir, 21, 4604 (2005). M. C. Lafouresse, U. Bertocci, C. R. Beauchamp, and G. R. Stafford, J. Electrochem. Soc. 159, H816 (2012). M. C. Lafouresse, U. Bertocci, and G. R. Stafford, J. Electrochem. Soc. 160, H636 (2013).


2006 ◽  
Vol 600 (1) ◽  
pp. 23-32 ◽  
Author(s):  
David Fuster ◽  
María Ujué González ◽  
Yolanda González ◽  
Luisa González

2021 ◽  
Author(s):  
Omid Memarian Sorkhabi

Abstract Understanding how the movement of faults and deformation affects such as motion-induced surface stress and strain, which is very important in seismic regions. The best way to learn about the effects of fault movement is modeled. For example, the modeling of surface displacement or deformation and the amount of damage earthquake can be estimated by the model. Coulomb stress changes can be modeled or predicted earthquake aftershocks or future Earthquakes. we employ assumptions on the orientations, rupture lengths and average slip associated with each earthquake to calculate stress changes. Using this model, we displacement, stress and strain at any depth in the Earth's surface acquired. In this study the modeling of earthquakes Mw= 6.5, Mw=6.3 Ahar-Varzaghan. The earthquakes induced displacements, strains and stresses were calculated at the surface at an average depth and its aftershocks for 10-km Ahar and 4 km Varzaghan.


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