Layout dependent hot-carrier-injection-induced pLDMOS degradation from a non-destructive characterization viewpoint

2021 ◽  
pp. 108150
Author(s):  
D. Zhao ◽  
Y. Wang ◽  
Y. Chen ◽  
Z. Pang ◽  
Z. Fu ◽  
...  
Keyword(s):  
Carrier Injection ◽  
Hot Carrier ◽  
Hot Carrier Injection ◽  
Non Destructive ◽  
Non Destructive Characterization

Analysis of Hot Carrier Injection According to Gate Length

2019 ◽  
Vol 19 (10) ◽  
pp. 6746-6749 ◽  
Author(s):  
Taejin Jang ◽  
Myung-Hyun Baek ◽  
Min-Woo Kwon ◽  
Sungmin Hwang ◽  
Jeesoo Chang ◽  
...  
Keyword(s):  
Gate Length ◽  
Carrier Injection ◽  
Hot Carrier ◽  
Hot Carrier Injection
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