Structural and mechanical characterization of nanostructured titanium oxide thin films deposited by filtered cathodic vacuum arc

2013 ◽  
Vol 227 ◽  
pp. 42-47 ◽  
Author(s):  
Carlo Paternoster ◽  
Igor Zhirkov ◽  
Marie-Paule Delplancke-Ogletree
2003 ◽  
Vol 37 (1) ◽  
pp. 81-85 ◽  
Author(s):  
Z H Gan ◽  
G Q Yu ◽  
B K Tay ◽  
C M Tan ◽  
Z W Zhao ◽  
...  

2005 ◽  
Vol 04 (04) ◽  
pp. 795-801
Author(s):  
B. K. TAY ◽  
Z. W. ZHAO ◽  
S. P. LAU ◽  
J. X. GAO

Titanium oxide and zirconium oxide thin films were deposited at low temperatures (not exceeding 350°C) by off-plane filtered cathodic vacuum arc (FCVA). The film structures were studied by XRD and Raman spectra. For titanium oxide thin films, amorphous structure remains up to 230°C, and anatase film with the crystallite size of 16 nm is observed at 330°C as confirmed by XRD and Raman analysis. For zirconium oxide, the film structure develops from amorphous at room temperature to polycrystalline state at 150°C and above. Moreover, for the crystallized films, preferred orientation is along [-111] direction. At 150°C the films possess nano-sized crystallites (less than 15 nm). For these two kinds of metal oxide thin films, surface roughness both increases with the growth temperature.


2012 ◽  
Vol 7 (3) ◽  
pp. 317-321
Author(s):  
Yongfeng Ju ◽  
Zhiming Wu ◽  
Shibin Li ◽  
Xiang Dong ◽  
Yadong Jiang

2004 ◽  
Vol 109 (1-3) ◽  
pp. 249-251 ◽  
Author(s):  
J Domaradzki ◽  
E.L Prociow ◽  
D Kaczmarek ◽  
T Berlicki ◽  
A Podhorodecki ◽  
...  

2009 ◽  
Vol 46 (1-2) ◽  
pp. 209-216 ◽  
Author(s):  
Diana Mardare ◽  
Nicoleta Cornei ◽  
G.I. Rusu

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