Silicone-based modified layer obtained by low-energy nitrogen ion beam as diaphragm for environmental transmission electron microscope

2020 ◽  
Vol 385 ◽  
pp. 125448
Author(s):  
Yuki Tai ◽  
Takaomi Matsutani ◽  
Tadahiro Kawasaki
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Ion Beam ◽  
Low Energy ◽  
Environmental Transmission ◽  
Transmission Electron ◽  
Modified Layer ◽  
Nitrogen Ion

Light-Induced Reduction of Cuprous Oxide in an Environmental Transmission Electron Microscope

ChemCatChem ◽  
2013 ◽  
Vol 5 (9) ◽  
pp. 2667-2672 ◽  
Author(s):  
Filippo Cavalca ◽  
Anders B. Laursen ◽  
Jakob B. Wagner ◽  
Christian D. Damsgaard ◽  
Ib Chorkendorff ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Cuprous Oxide ◽  
Environmental Transmission ◽  
Transmission Electron

Transmission Electron Microscope Specimen Preparation of Metal Matrix Composites Using the Focused Ion Beam Miller

2000 ◽  
Vol 6 (5) ◽  
pp. 452-462 ◽  
Author(s):  
Julie M. Cairney ◽  
Robert D. Smith ◽  
Paul R. Munroe
Keyword(s):  
Electron Microscope ◽  
Metal Matrix Composites ◽  
Transmission Electron Microscope ◽  
Metal Matrix ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Matrix Composites ◽  
Transmission Electron ◽  
The Matrix ◽  
Ceramic Reinforcement

AbstractTransmission electron microscope samples of two types of metal matrix composites were prepared using both traditional thinning methods and the more novel focused ion beam miller. Electropolishing methods were able to produce, very rapidly, thin foils where the matrix was electron transparent, but the ceramic reinforcement particles remained unthinned. Thus, it was not possible in these foils to study either the matrix-reinforcement interface or the microstructure of the reinforcement particles themselves. In contrast, both phases in the composites prepared using the focused ion beam miller thinned uniformly. The interfaces in these materials were clearly visible and the ceramic reinforcement was electron transparent. However, microstructural artifacts associated with ion beam damage were also observed. The extent of these artifacts and methods of minimizing their effect were dependent on both the materials and the milling conditions used.

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