Structural study of nanoporous ultra low-k dielectrics using complementary techniques: Ellipsometric porosimetry, X-ray reflectivity and grazing incidence small-angle X-ray scattering

2007 ◽  
Vol 254 (2) ◽  
pp. 473-479 ◽  
Author(s):  
V. Jousseaume ◽  
G. Rolland ◽  
D. Babonneau ◽  
J.-P. Simon
2005 ◽  
Vol 472 (1-2) ◽  
pp. 323-327 ◽  
Author(s):  
C.-H. Hsu ◽  
U-Ser Jeng ◽  
Hsin-Yi Lee ◽  
Chih-Mon Huang ◽  
K.S. Liang ◽  
...  

FEBS Letters ◽  
2019 ◽  
Vol 593 (12) ◽  
pp. 1360-1371 ◽  
Author(s):  
Liubov A. Dadinova ◽  
Yurii M. Chesnokov ◽  
Roman A. Kamyshinsky ◽  
Ivan A. Orlov ◽  
Maxim V. Petoukhov ◽  
...  

2014 ◽  
Vol 115 (20) ◽  
pp. 204311 ◽  
Author(s):  
Nie Zhao ◽  
Chunming Yang ◽  
Qian Zhang ◽  
Xueming Lu ◽  
Yuzhu Wang ◽  
...  

1999 ◽  
Vol 86 (12) ◽  
pp. 6763-6769 ◽  
Author(s):  
Markus Rauscher ◽  
Rogerio Paniago ◽  
Hartmut Metzger ◽  
Zoltan Kovats ◽  
Jan Domke ◽  
...  

2007 ◽  
Vol 78 (11) ◽  
pp. 113910 ◽  
Author(s):  
M. A. Singh ◽  
M. N. Groves ◽  
M. S. Müller ◽  
I. J. Stahlbrand ◽  
D.-M. Smilgies

2010 ◽  
Vol 22 (47) ◽  
pp. 474003 ◽  
Author(s):  
Hiroshi Okuda ◽  
Masayuki Kato ◽  
Keiji Kuno ◽  
Shojiro Ochiai ◽  
Noritaka Usami ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document