Temperature dependent study on the microwave noise performance of metamorphic InP/InGaAs heterojunction bipolar transistors

2007 ◽  
Vol 515 (10) ◽  
pp. 4514-4516 ◽  
Author(s):  
Hong Yang ◽  
Hong Wang ◽  
K. Radhakrishnan
2010 ◽  
Vol 4 (11) ◽  
pp. 335-337 ◽  
Author(s):  
A. Shimukovitch ◽  
P. Sakalas ◽  
P. Zampardi ◽  
M. Schroter ◽  
A. Matulionis

2016 ◽  
Vol 2016 ◽  
pp. 1-5
Author(s):  
Chie-In Lee ◽  
Yan-Ting Lin ◽  
Wei-Cheng Lin

Noise parameters of silicon germanium (SiGe) heterojunction bipolar transistors (HBTs) for different sizes are investigated in the breakdown region for the first time. When the emitter length of SiGe HBTs shortens, minimum noise figure at breakdown decreases. In addition, narrower emitter width also decreases noise figure of SiGe HBTs in the avalanche region. Reduction of noise performance for smaller emitter length and width of SiGe HBTs at breakdown resulted from the lower noise spectral density resulting from the breakdown mechanism. Good agreement between experimental and simulated noise performance at breakdown is achieved for different sized SiGe HBTs. The presented analysis can benefit the RF circuits operating in the breakdown region.


2001 ◽  
Vol 49 (12) ◽  
pp. 2408-2412 ◽  
Author(s):  
S. Halder ◽  
Yong Zhong Xiong ◽  
Geok-Ing Ng ◽  
Hong Wang ◽  
Haiqun Zheng ◽  
...  

2000 ◽  
Vol 15 (12) ◽  
pp. 1101-1106 ◽  
Author(s):  
Hsi-Jen Pan ◽  
Wei-Chou Wang ◽  
Kong-Beng Thei ◽  
Chin-Chuan Cheng ◽  
Kuo-Hui Yu ◽  
...  

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