Comparison between the structural, morphological and optical properties of CdS layers prepared by Close Space Sublimation and RF magnetron sputtering for CdTe solar cells

2011 ◽  
Vol 519 (21) ◽  
pp. 7596-7599 ◽  
Author(s):  
E.M. Feldmeier ◽  
A. Fuchs ◽  
J. Schaffner ◽  
H.-J. Schimper ◽  
A. Klein ◽  
...  
2012 ◽  
Vol 1432 ◽  
Author(s):  
Jonathan D. Major ◽  
Leon Bowen ◽  
Robert E. Treharne ◽  
Ken Durose

ABSTRACTTwo issues relating to the determination of junction position in thin film CdTe solar cells have been investigated. Firstly, the use of a focussed ion beam (FIB) milling as a method of sample preparation for electron beam induced current (EBIC) analysis is demonstrated. It is superior to fracturing methods. High quality secondary electron and combined secondary electron/EBIC images are presented and interpreted for solar cells with CdTe layers deposited by both close space sublimation (CSS) or RF sputtering. Secondly, it was shown that in an RF-sputtered CdTe device, while the photovoltaic junction was buried ~1.1 μm from the metallurgical interface, the shape of the external quantum efficiency (EQE) curve did not indicate the presence of a buried homo-junction. SCAPS modelling was used to verify that EQE curve shapes are not sensitive to junctions buried < 1.5μm from the CdTe/CdS interface.


1996 ◽  
Author(s):  
A. D. Compaan ◽  
M. Shao ◽  
C. N. Tabory ◽  
Z. Feng ◽  
A. Fischer ◽  
...  

2016 ◽  
Vol 34 (2) ◽  
pp. 021202 ◽  
Author(s):  
Drew E. Swanson ◽  
Jason M. Kephart ◽  
Pavel S. Kobyakov ◽  
Kevin Walters ◽  
Kevan C. Cameron ◽  
...  

2013 ◽  
Vol 62 (18) ◽  
pp. 188801
Author(s):  
Zhao Shou-Ren ◽  
Huang Zhi-Peng ◽  
Sun Lei ◽  
Sun Peng-Chao ◽  
Zhang Chuan-Jun ◽  
...  

2017 ◽  
Vol 9 (5) ◽  
pp. 05035-1-05035-6 ◽  
Author(s):  
G. I. Kopach ◽  
◽  
R. P. Mygushchenko ◽  
G. S. Khrypunov ◽  
A. I. Dobrozhan ◽  
...  

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