Improvement of bias stability of indium zinc oxide thin film transistors by the incorporation of hafnium fabricated by radio-frequency magnetron sputtering

2011 ◽  
Vol 519 (20) ◽  
pp. 6881-6883 ◽  
Author(s):  
Eugene Chong ◽  
Yoon Soo Chun ◽  
Seung Han Kim ◽  
Sang Yeol Lee
Keyword(s):  
Thin Film ◽  
Zinc Oxide ◽  
Magnetron Sputtering ◽  
Radio Frequency ◽  
Thin Film Transistors ◽  
Oxide Thin Film ◽  
Radio Frequency Magnetron Sputtering ◽  
Zinc Oxide Thin Film ◽  
Indium Zinc Oxide ◽  
Bias Stability

Influence of Illumination on the Negative-Bias Stability of Transparent Hafnium–Indium–Zinc Oxide Thin-Film Transistors

2010 ◽  
Vol 31 (5) ◽  
pp. 440-442 ◽  
Author(s):  
Joon Seok Park ◽  
Tae Sang Kim ◽  
Kyoung Seok Son ◽  
Ji Sim Jung ◽  
Kwang-Hee Lee ◽  
...  
Keyword(s):  
Thin Film ◽  
Zinc Oxide ◽  
Thin Film Transistors ◽  
Oxide Thin Film ◽  
Negative Bias ◽  
Zinc Oxide Thin Film ◽  
Indium Zinc Oxide ◽  
Bias Stability

Improvement in Photo-Bias Stability of High-Mobility Indium Zinc Oxide Thin-Film Transistors by Oxygen High-Pressure Annealing

2013 ◽  
Vol 34 (7) ◽  
pp. 894-896 ◽  
Author(s):  
Se Yeob Park ◽  
Cheol Seong Hwang ◽  
Hyeong Joon Kim ◽  
Jae Kyeong Jeong ◽  
Ji Hun Song ◽  
...  
Keyword(s):  
Thin Film ◽  
High Pressure ◽  
Zinc Oxide ◽  
Thin Film Transistors ◽  
High Mobility ◽  
Oxide Thin Film ◽  
Zinc Oxide Thin Film ◽  
Indium Zinc Oxide ◽  
Bias Stability
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