Characteristics of Gallium-Doped Zinc Oxide Thin-Film Transistors Fabricated at Room Temperature Using Radio Frequency Magnetron Sputtering Method
2008 ◽
Vol 47
(1)
◽
pp. 87-90
◽
2007 ◽
Vol 16
(5)
◽
pp. 359-365
◽
2007 ◽
Vol 51
(6)
◽
pp. 1999
◽
2018 ◽
Vol 51
(25)
◽
pp. 255105
◽
2017 ◽
Vol 56
(4S)
◽
pp. 04CG06
◽
Keyword(s):
2008 ◽
Vol 52
(5)
◽
pp. 813-816
◽
2011 ◽
Keyword(s):
2010 ◽
Vol 71
(12)
◽
pp. 1760-1762
◽