High-temperature isothermal capacitance transient spectroscopy study on SiN deposition damages for low-Mg-doped p-GaN Schottky diodes

2014 ◽  
Vol 557 ◽  
pp. 268-271 ◽  
Author(s):  
Kenji Shiojima ◽  
Hisashi Wakayama ◽  
Toshichika Aoki ◽  
Naoki Kaneda ◽  
Kazuki Nomoto ◽  
...  
1990 ◽  
Vol 67 (3) ◽  
pp. 1380-1383 ◽  
Author(s):  
Eun Kyu Kim ◽  
Hoon Young Cho ◽  
Suk‐Ki Min ◽  
Sung Ho Choh ◽  
Susumu Namba

1989 ◽  
Vol 28 (Part 2, No. 4) ◽  
pp. L714-L716 ◽  
Author(s):  
Takao Maeda ◽  
Sakae Meguro ◽  
Masasuke Takata

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