High-temperature isothermal capacitance transient spectroscopy study on SiN deposition damages for low-Mg-doped p-GaN Schottky diodes
2013 ◽
Vol 52
(11S)
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pp. 11NH03
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1993 ◽
Vol 2
(8)
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pp. 1179-1184
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1987 ◽
Vol 97-98
◽
pp. 723-726
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2002 ◽
Vol 210-212
◽
pp. 1-14
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2017 ◽
pp. 355-358
1989 ◽
Vol 28
(Part 2, No. 4)
◽
pp. L714-L716
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