Wear characteristics of diamond-coated atomic force microscope probe

2007 ◽  
Vol 108 (1) ◽  
pp. 1-10 ◽  
Author(s):  
Koo-Hyun Chung ◽  
Dae-Eun Kim
Keyword(s):  
Atomic Force Microscope ◽  
Atomic Force Microscope Probe ◽  
Wear Characteristics ◽  
Atomic Force ◽  
Microscope Probe

Wear Characteristics of Atomic Force Microscope Probe Tips

2005 ◽  
Author(s):  
Koo-Hyun Chung ◽  
Dae-Eun Kim
Keyword(s):  
Electron Microscope ◽  
Atomic Force Microscope ◽  
Atomic Force Microscope Probe ◽  
Wear Characteristics ◽  
Atomic Force ◽  
Transmission Electron ◽  
Afm Probe ◽  
Silicon Silicon ◽  
Microscope Probe ◽  
Scanning Electron

In the field of nanotechnology, Atomic Force Microscope (AFM) which is based on the interactions between an extremely sharp probe tip and specimen, has been widely utilized. In the AFM and AFM-based applications, the probe tip wear problem should be carefully considered. In this work, the wear characteristics of silicon, silicon nitride, and diamond coated probe tip under light loads were investigated. In order to identify the structure of the AFM probe tips as well as the nature of wear, High-Resolution Transmission Electron Microscope (HRTEM) and Field Emission Scanning Electron Microscope (FESEM) analyses were utilized. Using the Archard’s wear equation, the degree of the probe tip wear was quantitatively assessed. Based on the experimental results and analysis, the plausible wear mechanisms of the AFM probe tips were proposed in an effort to understand the nano-scale wear.

Nanolocalized charge writing in thin SiO2 layers with embedded silicon nanocrystals under an atomic force microscope probe

2007 ◽  
Vol 33 (10) ◽  
pp. 889-892 ◽  
Author(s):  
M. S. Dunaevskii ◽  
A. N. Titkov ◽  
S. Yu. Larkin ◽  
A. B. Speshilova ◽  
S. E. Aleksandrov ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Silicon Nanocrystals ◽  
Atomic Force Microscope Probe ◽  
Atomic Force ◽  
Microscope Probe

scholarly journals A local field emission study of partially aligned carbon-nanotubes by atomic force microscope probe

Carbon ◽  
2007 ◽  
Vol 45 (15) ◽  
pp. 2957-2971 ◽  
Author(s):  
A. Di Bartolomeo ◽  
A. Scarfato ◽  
F. Giubileo ◽  
F. Bobba ◽  
M. Biasiucci ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Atomic Force Microscope ◽  
Field Emission ◽  
Local Field ◽  
Atomic Force Microscope Probe ◽  
Atomic Force ◽  
Aligned Carbon Nanotubes ◽  
Emission Study ◽  
Microscope Probe

5513 Development of 4 point probe with an atomic force microscope probe function

2006 ◽  
Vol 2006.7 (0) ◽  
pp. 311-312
Author(s):  
Masafumi Takahashi ◽  
Kenjiro Ayano ◽  
Gen Hashiguchi ◽  
Takashi Yokokawa ◽  
Hiroyuki Fujita
Keyword(s):  
Atomic Force Microscope ◽  
Atomic Force Microscope Probe ◽  
Atomic Force ◽  
Microscope Probe
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