Investigations of local electrical properties using tunneling/atomic force microscope with a quartz tuning fork nearfield sensor
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2012 ◽
Vol 12
(7)
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pp. 5754-5758
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2015 ◽
Vol 15
(9)
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pp. 1015-1021
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2013 ◽
Vol 56
(5)
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pp. 584-588
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2014 ◽
Vol 85
(3)
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pp. 033702
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2015 ◽
Vol 232
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pp. 259-266
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