Nanopipette/Nanorod-Combined Quartz Tuning Fork–Atomic Force Microscope

We introduce a nanopipette/quartz tuning fork (QTF)–atomic force microscope (AFM) for nanolithography and a nanorod/QTF–AFM for nanoscratching with in situ detection of shear dynamics during performance. Capillary-condensed nanoscale water meniscus-mediated and electric field-assisted small-volume liquid ejection and nanolithography in ambient conditions are performed at a low bias voltage (~10 V) via a nanopipette/QTF–AFM. We produce and analyze Au nanoparticle-aggregated nanowire by using nanomeniscus-based particle stacking via a nanopipette/QTF–AFM. In addition, we perform a nanoscratching technique using in situ detection of the mechanical interactions of shear dynamics via a nanorod/QTF–AFM with force sensor capability and high sensitivity.

Download Full-text

Amplitude calibration of quartz tuning fork (QTF) force sensor with an atomic force microscope

2017 IEEE 17th International Conference on Nanotechnology (IEEE-NANO) ◽

10.1109/nano.2017.8117406 ◽

2017 ◽

Author(s):

Danish Hussain ◽

Hao Zhang ◽

Jianmin Song ◽

Wen Yongbing ◽

Xianghe Meng ◽

...

Keyword(s):

Atomic Force Microscope ◽

Tuning Fork ◽

Quartz Tuning Fork ◽

Force Sensor ◽

Atomic Force

Download Full-text

Low-volume liquid delivery and nanolithography using a nanopipette combined with a quartz tuning fork-atomic force microscope

Nanoscale ◽

10.1039/c2nr30972f ◽

2012 ◽

Vol 4 (20) ◽

pp. 6493 ◽

Cited By ~ 21

Author(s):

Sangmin An ◽

Corey Stambaugh ◽

Gunn Kim ◽

Manhee Lee ◽

Yonghee Kim ◽

...

Keyword(s):

Atomic Force Microscope ◽

Tuning Fork ◽

Quartz Tuning Fork ◽

Atomic Force ◽

Low Volume ◽

Liquid Delivery

Download Full-text

Optical microscope combined with the nanopipette-based quartz tuning fork-atomic force microscope for nanolithography

10.1117/12.2036779 ◽

2013 ◽

Author(s):

Sangmin An ◽

Corey Stambaugh ◽

Soyoung Kwon ◽

Kunyoung Lee ◽

Bongsu Kim ◽

...

Keyword(s):

Atomic Force Microscope ◽

Tuning Fork ◽

Quartz Tuning Fork ◽

Optical Microscope ◽

Atomic Force

Download Full-text

Atomic resolution on Si(111)-(7×7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork

Applied Physics Letters ◽

10.1063/1.126067 ◽

2000 ◽

Vol 76 (11) ◽

pp. 1470-1472 ◽

Cited By ~ 381

Author(s):

Franz J. Giessibl

Keyword(s):

Atomic Force Microscopy ◽

Tuning Fork ◽

Quartz Tuning Fork ◽

Force Sensor ◽

Atomic Resolution ◽

Force Microscopy ◽

Atomic Force

Download Full-text

Enhanced Formation of a Confined Nano-Water Meniscus Using a 780 nm Laser with a Quartz Tuning Fork-Atomic Force Microscope

Journal of Nanoscience and Nanotechnology ◽

10.1166/jnn.2012.6256 ◽

2012 ◽

Vol 12 (7) ◽

pp. 5754-5758

Author(s):

Sangmin An ◽

Kunyoung Lee ◽

Geol Moon ◽

Wan Bak ◽

Gunn Kim ◽

...

Keyword(s):

Atomic Force Microscope ◽

Tuning Fork ◽

Quartz Tuning Fork ◽

Atomic Force ◽

Water Meniscus

Download Full-text

Transport in Thermal Dip Pen Nanolithography

Design, Synthesis, and Applications ◽

10.1115/nano2004-46074 ◽

2004 ◽

Author(s):

Brent A. Nelson ◽

Tanya L. Wright ◽

William P. King ◽

Paul E. Sheehan ◽

Lloyd J. Whitman

Keyword(s):

Electron Beam ◽

Atomic Force Microscope ◽

Electron Beam Lithography ◽

Room Temperature ◽

Optical Lithography ◽

Ambient Conditions ◽

Atomic Force ◽

Resolution Limits ◽

Dip Pen Nanolithography

The manufacture of nanoscale devices is at present constrained by the resolution limits of optical lithography and the high cost of electron beam lithography. Furthermore, traditional silicon fabrication techniques are quite limited in materials compatibility and are not well-suited for the manufacture of organic and biological devices. One nanomanufacturing technique that could overcome these drawbacks is dip pen nanolithography (DPN), in which a chemical-coated atomic force microscope (AFM) tip deposits molecular ‘inks’ onto a substrate [1]. DPN has shown resolution as good as 5 nm [2] and has been performed with a large number of molecules, but has limitations. For molecules to ink the surface they must be mobile at room temperature, limiting the inks that can be used, and since the inks must be mobile in ambient conditions, there is no way to stop the deposition while the tip is in contact with the substrate. In-situ imaging of deposited molecules therefore causes contamination of the deposited features.

Download Full-text