Determination of the optical constants of HfO2–SiO2 composite thin films through reverse fitting of transmission spectra

Vacuum ◽  
2011 ◽  
Vol 86 (4) ◽  
pp. 422-428 ◽  
Author(s):  
N.M. Kamble ◽  
R.B. Tokas ◽  
A. Biswas ◽  
S. Thakur ◽  
D. Bhattacharyya ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Constants ◽  
Transmission Spectra ◽  
Composite Thin Films

Determination of the thickness and optical constants of thin films from transmission spectra

1996 ◽  
Vol 286 (1-2) ◽  
pp. 164-169 ◽  
Author(s):  
M Kubinyi ◽  
N Benkö ◽  
A Grofcsik ◽  
W.Jeremy Jones
Keyword(s):  
Thin Films ◽  
Optical Constants ◽  
Transmission Spectra

DETERMINATION OF THE OPTICAL CONSTANTS AND THICKNESS OF SEMITRANSPARENT THIN FILMS USING SUCCESSIVE INTERFERENCE FRINGES OF TRANSMISSION SPECTRA

2005 ◽  
Vol 12 (03) ◽  
pp. 425-431 ◽  
Author(s):  
F. E. GHODSI
Keyword(s):  
Thin Films ◽  
Optical Constants ◽  
Optical Parameters ◽  
Transmission Spectra ◽  
Simple Method ◽  
Interference Fringes ◽  
True Values ◽  
Better Than ◽  
Good Agreement

A simple method for determination of optical constants and thickness of semitransparent thin films deposited onto a transparent finite substrate has been developed. The method is based on the analysis of successive interference fringes of transmission spectra created by the films. It is essentially not necessary to obtain the envelope of transmission spectra in this method. The determined values of optical parameters are in good agreement with their true values used to generate transmission data. The accuracy of method in determining refractive index and thickness of the films is better than 1%.

Determination of the Optical Constants of Thin Films Using Photoacoustic Spectroscopy

1981 ◽  
Vol 20 (9) ◽  
pp. L665-L668 ◽  
Author(s):  
Satoshi Yamasaki ◽  
Hideyo Okushi ◽  
Akihisa Matsuda ◽  
Hidetoshi Oheda ◽  
Nobuhiro Hata ◽  
...  
Keyword(s):  
Thin Films ◽  
Photoacoustic Spectroscopy ◽  
Optical Constants

Accurate Determination of Optical Constants of Amorphous Absorbing Thin Films by Spectroscopic Ellipsometry

2015 ◽  
Vol 35 (4) ◽  
pp. 0431001 ◽  
Author(s):  
李江 Li Jiang ◽  
李沛 Li Pei ◽  
黄峰 Huang Feng ◽  
魏贤华 Wei Xianhua ◽  
葛芳芳 Ge Fangfang ◽  
...  
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Accurate Determination

scholarly journals Experimental Determination of Complex Optical Constants of Air‐Stable Inorganic CsPbI 3 Perovskite Thin Films

2020 ◽  
Vol 14 (6) ◽  
pp. 2000070 ◽  
Author(s):  
Wensheng Yan ◽  
Yi Guo ◽  
Deski Beri ◽  
Stephan Dottermusch ◽  
Haining Chen ◽  
...  
Keyword(s):  
Thin Films ◽  
Experimental Determination ◽  
Optical Constants

Determination of optical constants of thin films and multilayer stacks by use of concurrent reflectance, transmittance, and ellipsometric measurements

2001 ◽  
Vol 40 (28) ◽  
pp. 5088 ◽  
Author(s):  
Chubing Peng ◽  
Rongguang Liang ◽  
J. Kevin Erwin ◽  
Warren Bletscher ◽  
Kenichi Nagata ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Constants ◽  
Multilayer Stacks
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