Robust and baseline-free full-field defect detection in complex composite parts through weighted broadband energy mapping of mode-removed guided waves

2021 ◽  
Vol 151 ◽  
pp. 107360 ◽  
Author(s):  
Joost Segers ◽  
Saeid Hedayatrasa ◽  
Gaétan Poelman ◽  
Wim Van Paepegem ◽  
Mathias Kersemans
Keyword(s):  
Defect Detection ◽  
Guided Waves ◽  
Full Field ◽  
Energy Mapping ◽  
Field Defect

J0402-3-4 Defect detection of welded elbow pipes using T(0,1) mode guided waves

2010 ◽  
Vol 2010.6 (0) ◽  
pp. 415-416
Author(s):  
Yuki MIZOBUCHI ◽  
Shuichi MASUDA ◽  
Kenichi YOSHIDA ◽  
Hideo NISHINO
Keyword(s):  
Defect Detection ◽  
Guided Waves

106 Development of the defect detection technology for underground piping by using the high-powered guided waves

2015 ◽  
Vol 2015.14 (0) ◽  
pp. 21-25
Author(s):  
Motoki GOKA ◽  
Itaru MIURA ◽  
Hideo NISHINO ◽  
Takashi FURUKAWA ◽  
Toshihiro YAMAMOTO ◽  
...  
Keyword(s):  
Defect Detection ◽  
Guided Waves ◽  
Detection Technology

Defect detection in pipes using guided waves

Ultrasonics ◽  
1998 ◽  
Vol 36 (1-5) ◽  
pp. 147-154 ◽  
Author(s):  
M.J.S. Lowe ◽  
D.N. Alleyne ◽  
P. Cawley
Keyword(s):  
Defect Detection ◽  
Guided Waves

scholarly journals Non Destructive Investigation of Defects in Composite Structures by Full-Field Measurement Methods

2013 ◽  
Vol 550 ◽  
pp. 135-142
Author(s):  
Elodie Péronnet ◽  
Marie Laetitia Pastor ◽  
Richard Huillery ◽  
Olivier Dalverny ◽  
Sébastien Mistou ◽  
...  
Keyword(s):  
Defect Detection ◽  
Field Measurement ◽  
Composite Structures ◽  
Measurement Methods ◽  
Sandwich Composite ◽  
Full Field ◽  
X Ray ◽  
Full Field Measurement ◽  
Application Fields ◽  
Non Destructive

This paper presents different interests of non destructive full-field measurement. More precisely, it focuses on the characterization and the comparison of the X-ray tomography and two methods of infrared thermography in order to define the defect detection limits and to precise the specific application fields for each technique on multi-layered and sandwich composite structures. The obtained results are qualitatively and quantitatively analyzed.

scholarly journals Defect detection in monocrystalline silicon wafers using high frequency guided waves

2019 ◽  
Author(s):  
Bernard Masserey ◽  
Mathieu Simon ◽  
Jean-Luc Robyr ◽  
Paul Fromme
Keyword(s):  
Defect Detection ◽  
High Frequency ◽  
Guided Waves ◽  
Silicon Wafers ◽  
Monocrystalline Silicon

Effects of pupil discretization and Littrow illumination in the simulation of bright-field defect detection

2009 ◽  
Vol 34 (12) ◽  
pp. 1840
Author(s):  
Stephan Rafler ◽  
Matthias Petschow ◽  
Uwe Seifert ◽  
Karsten Frenner ◽  
Jens Göckeritz ◽  
...  
Keyword(s):  
Defect Detection ◽  
Bright Field ◽  
Field Defect
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